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Acceptance of the Fourier transform microscopes for nuclear emulsion

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Abstract

A new term - acceptance of the Fourier transform (FT) microscopes - for nuclear emulsion is introduced. It is shown that this term is of the universal feature and can be used in various designs of these microscopes. In the frame of this new approach the problem of the measurement of the dip angle of the straight line particle track by means of the FT microscopes is analyzed. The structure of the signals at the output of the FT microscope in the real conditions is presented. 13 refs.; 14 figs.
Authors:
Soroko, L M [1] 
  1. Joint Inst. for Nuclear Research, Dubna (Russian Federation). Lab. of Nuclear Problems
Publication Date:
Dec 31, 1991
Product Type:
Technical Report
Report Number:
JINR-E-13-91-474
Reference Number:
SCA: 440104; PA: AIX-24:007638; SN: 93000932439
Resource Relation:
Other Information: PBD: 1991
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; OPTICAL MICROSCOPES; FOURIER ANALYSIS; NUCLEAR EMULSIONS; BEAM ACCEPTANCE; PARTICLE TRACKS; 440104; HIGH ENERGY PHYSICS INSTRUMENTATION
OSTI ID:
10119167
Research Organizations:
Joint Inst. for Nuclear Research, Dubna (Russian Federation)
Country of Origin:
JINR
Language:
English
Other Identifying Numbers:
Other: ON: DE93612611; TRN: RU9207243007638
Availability:
OSTI; NTIS (US Sales Only); INIS
Submitting Site:
INIS
Size:
[14] p.
Announcement Date:
Jun 30, 2005

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Citation Formats

Soroko, L M. Acceptance of the Fourier transform microscopes for nuclear emulsion. JINR: N. p., 1991. Web.
Soroko, L M. Acceptance of the Fourier transform microscopes for nuclear emulsion. JINR.
Soroko, L M. 1991. "Acceptance of the Fourier transform microscopes for nuclear emulsion." JINR.
@misc{etde_10119167,
title = {Acceptance of the Fourier transform microscopes for nuclear emulsion}
 author = {Soroko, L M}
 abstractNote = {A new term - acceptance of the Fourier transform (FT) microscopes - for nuclear emulsion is introduced. It is shown that this term is of the universal feature and can be used in various designs of these microscopes. In the frame of this new approach the problem of the measurement of the dip angle of the straight line particle track by means of the FT microscopes is analyzed. The structure of the signals at the output of the FT microscope in the real conditions is presented. 13 refs.; 14 figs.}
 place = {JINR}
 year = {1991}
 month = {Dec}
 }