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Thickness determination of metallic films by x-ray fluorescence spectrometry with wavelength dispersion; Determinacao de espessura de filmes metalicos por espectrometria de fluorescencia de raios-x por dispersao de comprimento de onda

Miscellaneous:

Abstract

Short communication.
Publication Date:
Dec 31, 1991
Product Type:
Miscellaneous
Report Number:
INIS-BR-3077; CONF-9110453-
Reference Number:
SCA: 400101; PA: AIX-24:004718; SN: 93000929969
Resource Relation:
Conference: 31. Brazilian Congress on Chemistry,Recife (Brazil),21-25 Oct 1991; Other Information: PBD: 1991
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; THIN FILMS; THICKNESS; ALUMINIUM; EVAPORATION; GLASS; NICKEL; SUBSTRATES; X-RAY FLUORESCENCE ANALYSIS; 400101; ACTIVATION, NUCLEAR REACTION, RADIOMETRIC, AND RADIOCHEMICAL PROCEDURES
OSTI ID:
10118233
Research Organizations:
Instituto de Pesquisas Energeticas e Nucleares (IPEN), Sao Paulo, SP (Brazil)
Country of Origin:
Brazil
Language:
Portuguese
Other Identifying Numbers:
Other: ON: DE93610549; TRN: BR9230504004718
Availability:
OSTI; NTIS (US Sales Only); INIS
Submitting Site:
INIS
Size:
[1] p.
Announcement Date:
Jun 30, 2005

Miscellaneous:

Citation Formats

Salvador, V L.R., and Scapin, Junior, W S. Thickness determination of metallic films by x-ray fluorescence spectrometry with wavelength dispersion; Determinacao de espessura de filmes metalicos por espectrometria de fluorescencia de raios-x por dispersao de comprimento de onda. Brazil: N. p., 1991. Web.
Salvador, V L.R., & Scapin, Junior, W S. Thickness determination of metallic films by x-ray fluorescence spectrometry with wavelength dispersion; Determinacao de espessura de filmes metalicos por espectrometria de fluorescencia de raios-x por dispersao de comprimento de onda. Brazil.
Salvador, V L.R., and Scapin, Junior, W S. 1991. "Thickness determination of metallic films by x-ray fluorescence spectrometry with wavelength dispersion; Determinacao de espessura de filmes metalicos por espectrometria de fluorescencia de raios-x por dispersao de comprimento de onda." Brazil.
@misc{etde_10118233,
title = {Thickness determination of metallic films by x-ray fluorescence spectrometry with wavelength dispersion; Determinacao de espessura de filmes metalicos por espectrometria de fluorescencia de raios-x por dispersao de comprimento de onda}
author = {Salvador, V L.R., and Scapin, Junior, W S}
abstractNote = {Short communication.}
place = {Brazil}
year = {1991}
month = {Dec}
}