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Characterization of highly charged ions by secondary electron emission

Conference:

Abstract

The secondary electron emission yield from a metal surface bombarded by highly charged ions is measured to determine the ratio of different ions whose (q/m) are identical and therefore cannot be selected by a magnetic spectrometer. For impact of Ar{sup q+} ions (4 {<=} q {<=} 14) and Ne{sup q+} ions (4 {<=} q {<=} 9), the total yields of secondary electrons appear to be linearly proportional to q{sup 2}. Thus the electron emission for the neutralization of {sup 40}Ar{sup 16+} can be estimated and the ion current ratio {sup 40}Ar{sup 16+}/{sup 15} N{sup 6+} is determined. (author).
Authors:
Publication Date:
Dec 31, 1993
Product Type:
Conference
Report Number:
CEA-CONF-11409; CONF-9305239-
Reference Number:
SCA: 663450; 663580; PA: AIX-25:007649; EDB-94:016165; ERA-19:007691; NTS-94:015111; SN: 94001127098
Resource Relation:
Conference: 11. international workshop on electron resonance ion sources,Groningen (Netherlands),5-8 May 1993; Other Information: PBD: 1993
Subject:
73 NUCLEAR PHYSICS AND RADIATION PHYSICS; ARGON 40 BEAMS; GOLD 197 TARGET; SECONDARY EMISSION; NEON 20 BEAMS; PARTICLE DISCRIMINATION; BEAM NEUTRALIZATION; ELECTRON CYCLOTRON-RESONANCE; MULTICHARGED IONS; NITROGEN 15 BEAMS; RADIATION DETECTION; 663450; 663580; HEAVY-ION-INDUCED REACTIONS AND SCATTERING; A = 190-219
OSTI ID:
10113852
Research Organizations:
CEA Centre d`Etudes de Grenoble, 38 (France). Dept. de Recherche Fondamentale sur la Matiere Condensee
Country of Origin:
France
Language:
English
Other Identifying Numbers:
Other: ON: DE94611370; TRN: FR9302956007649
Availability:
OSTI; NTIS (US Sales Only); INIS
Submitting Site:
FRN
Size:
13 p.
Announcement Date:
Jan 13, 1994

Conference:

Citation Formats

Delaunay, M. Characterization of highly charged ions by secondary electron emission. France: N. p., 1993. Web.
Delaunay, M. Characterization of highly charged ions by secondary electron emission. France.
Delaunay, M. 1993. "Characterization of highly charged ions by secondary electron emission." France.
@misc{etde_10113852,
title = {Characterization of highly charged ions by secondary electron emission}
author = {Delaunay, M}
abstractNote = {The secondary electron emission yield from a metal surface bombarded by highly charged ions is measured to determine the ratio of different ions whose (q/m) are identical and therefore cannot be selected by a magnetic spectrometer. For impact of Ar{sup q+} ions (4 {<=} q {<=} 14) and Ne{sup q+} ions (4 {<=} q {<=} 9), the total yields of secondary electrons appear to be linearly proportional to q{sup 2}. Thus the electron emission for the neutralization of {sup 40}Ar{sup 16+} can be estimated and the ion current ratio {sup 40}Ar{sup 16+}/{sup 15} N{sup 6+} is determined. (author).}
place = {France}
year = {1993}
month = {Dec}
}