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The use of a CCD imaging system for X-ray film intensity measurement

Technical Report:

Abstract

The use of a simple CCD-based imaging system for digitizing and x-ray film image is demonstrated. A method of extending the region of linear response of the film based upon an analytic representation of the observed response to a series of increasing exposures is described. The validity of the procedure is illustrated through an example of the absolute intensity measurement of a reflection of cadmium sulphide. 3 refs., 7 figs.
Publication Date:
Dec 31, 1994
Product Type:
Technical Report
Report Number:
UM-P-94/92
Reference Number:
SCA: 430303; PA: AIX-26:016601; EDB-95:030854; SN: 95001329456
Resource Relation:
Other Information: PBD: [1994]
Subject:
43 PARTICLE ACCELERATORS; IMAGE PROCESSING; CHARGE-COUPLED DEVICES; X-RAY RADIOGRAPHY; CADMIUM SULFIDES; EXPERIMENTAL DATA; OPTIMIZATION; PHOTOGRAPHIC FILMS; SENSITIVITY; SPATIAL RESOLUTION; 430303; EXPERIMENTAL FACILITIES AND EQUIPMENT
Sponsoring Organizations:
Australian Research Council, Canberra, ACT (Australia)
OSTI ID:
10113647
Research Organizations:
Melbourne Univ., Parkville, VIC (Australia). School of Physics
Country of Origin:
Australia
Language:
English
Other Identifying Numbers:
Other: ON: DE95615825; TRN: AU9414258016601
Availability:
OSTI; NTIS (US Sales Only); INIS
Submitting Site:
INIS
Size:
12 p.
Announcement Date:
Jun 30, 2005

Technical Report:

Citation Formats

Grigg, M W, and Barnea, Z. The use of a CCD imaging system for X-ray film intensity measurement. Australia: N. p., 1994. Web.
Grigg, M W, & Barnea, Z. The use of a CCD imaging system for X-ray film intensity measurement. Australia.
Grigg, M W, and Barnea, Z. 1994. "The use of a CCD imaging system for X-ray film intensity measurement." Australia.
@misc{etde_10113647,
title = {The use of a CCD imaging system for X-ray film intensity measurement}
author = {Grigg, M W, and Barnea, Z}
abstractNote = {The use of a simple CCD-based imaging system for digitizing and x-ray film image is demonstrated. A method of extending the region of linear response of the film based upon an analytic representation of the observed response to a series of increasing exposures is described. The validity of the procedure is illustrated through an example of the absolute intensity measurement of a reflection of cadmium sulphide. 3 refs., 7 figs.}
place = {Australia}
year = {1994}
month = {Dec}
}