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New method of error elimination in potential profile measurement of tokamak plasmas by high voltage heavy ion beam probes

Technical Report:

Abstract

The measurement of a potential profile in tokamak plasmas by heavy ion beam probe (HIBP) in a single shot is usually difficult, because as primary beam is swept through plasma cross-section, the secondary beam hits the input slit of an energy analyzer with a large variation in entrance angles (in-plane and out-plane). In this paper, a new method (the application of fast toroidal sweeps of the primary or the secondary beam at the analyzer or at an entrance to an tokamak) is proposed to eliminate the error due to the change in the entrance angle. In addition, results of a new calibration method of HIBP in tokamak (electron stripping by neutral gas) are presented. (author).
Publication Date:
Apr 01, 1992
Product Type:
Technical Report
Report Number:
NIFS-143
Reference Number:
SCA: 700320; PA: JPN-92:011115; SN: 93000918520
Resource Relation:
Other Information: PBD: Apr 1992
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; JIPPT-2 DEVICE; PLASMA DIAGNOSTICS; BEAM OPTICS; BEAM DYNAMICS; CESIUM IONS; PLASMA POTENTIAL; SPATIAL DISTRIBUTION; THALLIUM IONS; PLASMA RADIAL PROFILES; 700320; PLASMA DIAGNOSTIC TECHNIQUES AND INSTRUMENTATION
OSTI ID:
10111151
Research Organizations:
National Inst. for Fusion Science, Nagoya (Japan)
Country of Origin:
Japan
Language:
English
Other Identifying Numbers:
Other: ON: DE93753194; TRN: JP9211115
Availability:
OSTI; NTIS; INIS
Submitting Site:
JPN
Size:
34 p.
Announcement Date:
Jun 30, 2005

Technical Report:

Citation Formats

Hamada, Y, Masai, K, Kawasumi, Y, Iguchi, H, and Fujisawa, A. New method of error elimination in potential profile measurement of tokamak plasmas by high voltage heavy ion beam probes. Japan: N. p., 1992. Web.
Hamada, Y, Masai, K, Kawasumi, Y, Iguchi, H, & Fujisawa, A. New method of error elimination in potential profile measurement of tokamak plasmas by high voltage heavy ion beam probes. Japan.
Hamada, Y, Masai, K, Kawasumi, Y, Iguchi, H, and Fujisawa, A. 1992. "New method of error elimination in potential profile measurement of tokamak plasmas by high voltage heavy ion beam probes." Japan.
@misc{etde_10111151,
title = {New method of error elimination in potential profile measurement of tokamak plasmas by high voltage heavy ion beam probes}
author = {Hamada, Y, Masai, K, Kawasumi, Y, Iguchi, H, and Fujisawa, A}
abstractNote = {The measurement of a potential profile in tokamak plasmas by heavy ion beam probe (HIBP) in a single shot is usually difficult, because as primary beam is swept through plasma cross-section, the secondary beam hits the input slit of an energy analyzer with a large variation in entrance angles (in-plane and out-plane). In this paper, a new method (the application of fast toroidal sweeps of the primary or the secondary beam at the analyzer or at an entrance to an tokamak) is proposed to eliminate the error due to the change in the entrance angle. In addition, results of a new calibration method of HIBP in tokamak (electron stripping by neutral gas) are presented. (author).}
place = {Japan}
year = {1992}
month = {Apr}
}