Abstract
A comparison of the calculation of neutron reflectivity profiles R(Q) by optical matrix methods and a multilayer method, based on the kinematic approximation, has been made. The latter method provides a fast simple route to calculating R(Q) and may be used with confidence for systems of total thickness {<=}200 ``A`` for a scattering length density difference ``Delta`` of the order of 1.0 x 10{sup -5} A {sup -2}. For thicker layers the approximation is poor and the optical matrix method must be used for an accurate evaluation of such reflectivity data over a wide Q range. (author).
Citation Formats
Eastoe, J, and Penfold, J.
Comparison of kinematic and optical matrix methods for calculating reflectivity profiles of solid thin films and multilayers.
United Kingdom: N. p.,
1992.
Web.
Eastoe, J, & Penfold, J.
Comparison of kinematic and optical matrix methods for calculating reflectivity profiles of solid thin films and multilayers.
United Kingdom.
Eastoe, J, and Penfold, J.
1992.
"Comparison of kinematic and optical matrix methods for calculating reflectivity profiles of solid thin films and multilayers."
United Kingdom.
@misc{etde_10109223,
title = {Comparison of kinematic and optical matrix methods for calculating reflectivity profiles of solid thin films and multilayers}
author = {Eastoe, J, and Penfold, J}
abstractNote = {A comparison of the calculation of neutron reflectivity profiles R(Q) by optical matrix methods and a multilayer method, based on the kinematic approximation, has been made. The latter method provides a fast simple route to calculating R(Q) and may be used with confidence for systems of total thickness {<=}200 ``A`` for a scattering length density difference ``Delta`` of the order of 1.0 x 10{sup -5} A {sup -2}. For thicker layers the approximation is poor and the optical matrix method must be used for an accurate evaluation of such reflectivity data over a wide Q range. (author).}
place = {United Kingdom}
year = {1992}
month = {Jul}
}
title = {Comparison of kinematic and optical matrix methods for calculating reflectivity profiles of solid thin films and multilayers}
author = {Eastoe, J, and Penfold, J}
abstractNote = {A comparison of the calculation of neutron reflectivity profiles R(Q) by optical matrix methods and a multilayer method, based on the kinematic approximation, has been made. The latter method provides a fast simple route to calculating R(Q) and may be used with confidence for systems of total thickness {<=}200 ``A`` for a scattering length density difference ``Delta`` of the order of 1.0 x 10{sup -5} A {sup -2}. For thicker layers the approximation is poor and the optical matrix method must be used for an accurate evaluation of such reflectivity data over a wide Q range. (author).}
place = {United Kingdom}
year = {1992}
month = {Jul}
}