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Data reduction and analysis programs for neutron reflection studies of monolayer adsorption at interfaces

Technical Report:

Abstract

Data reduction and analysis programs for neutron reflectivity data from monolayer adsorption at interfaces are described. The application of model fitting to the reflectivity data, and the determination of partial structure factors within the kinematic approximation are discussed. Recent data for the adsorption of surfactants at the air-solution interface are used to illustrate the programs described. (author).
Authors:
Publication Date:
Jul 01, 1992
Product Type:
Technical Report
Report Number:
RAL-92-044
Reference Number:
SCA: 663610; PA: AIX-24:003925; SN: 93000913997
Resource Relation:
Other Information: PBD: Jul 1992
Subject:
73 NUCLEAR PHYSICS AND RADIATION PHYSICS; INTERFACES; ADSORPTION; NEUTRONS; REFLECTIVITY; CALCULATION METHODS; DATA ANALYSIS; DATA PROCESSING; EXPERIMENTAL DATA; LAYERS; NEUTRON REFLECTORS; 663610; NEUTRON PHYSICS
OSTI ID:
10109220
Research Organizations:
National Radiological Protection Board, Chilton (United Kingdom)
Country of Origin:
United Kingdom
Language:
English
Other Identifying Numbers:
Other: ON: DE93610132; TRN: GB9203054003925
Availability:
OSTI; NTIS (US Sales Only); INIS
Submitting Site:
GBN
Size:
[36] p.
Announcement Date:
Jun 30, 2005

Technical Report:

Citation Formats

Penfold, J. Data reduction and analysis programs for neutron reflection studies of monolayer adsorption at interfaces. United Kingdom: N. p., 1992. Web.
Penfold, J. Data reduction and analysis programs for neutron reflection studies of monolayer adsorption at interfaces. United Kingdom.
Penfold, J. 1992. "Data reduction and analysis programs for neutron reflection studies of monolayer adsorption at interfaces." United Kingdom.
@misc{etde_10109220,
title = {Data reduction and analysis programs for neutron reflection studies of monolayer adsorption at interfaces}
author = {Penfold, J}
abstractNote = {Data reduction and analysis programs for neutron reflectivity data from monolayer adsorption at interfaces are described. The application of model fitting to the reflectivity data, and the determination of partial structure factors within the kinematic approximation are discussed. Recent data for the adsorption of surfactants at the air-solution interface are used to illustrate the programs described. (author).}
place = {United Kingdom}
year = {1992}
month = {Jul}
}