Abstract
Thin PPS films (2{sub 10} {mu} thick) were bombarded with energetic {sup 1} H {sup +} (300 KeV), {sup 4} He {sup +} (380 KeV), {sup 10} B {sup +} (350 KeV) and {sup 40} Ar {sup ++} (700 KeV) ions, with fluences ranging from 10{sup 12} to 8 x 10{sup 14} ions/cm{sup 2}. The beam current density was 20 n A/cm{sup 2} in order to avoid sample heating. The modified samples were analysed by differential scanning calorimetry (DSC) and X-ray diffractometry. (author).
Rizzatti, M R;
Papaleo, R M;
Livi, R P;
[1]
Araujo, M.A. de
[2]
- Rio Grande do Sul Univ., Porto Alegre, RS (Brazil). Inst. de Fisica
- Rio Grande do Sul Univ., Porto Alegre, RS (Brazil). Inst. de Quimica
Citation Formats
Rizzatti, M R, Papaleo, R M, Livi, R P, and Araujo, M.A. de.
Crystallinity modification induced in poly(phenylene sulfide) (PPS) films by ion irradiation.
Brazil: N. p.,
1991.
Web.
Rizzatti, M R, Papaleo, R M, Livi, R P, & Araujo, M.A. de.
Crystallinity modification induced in poly(phenylene sulfide) (PPS) films by ion irradiation.
Brazil.
Rizzatti, M R, Papaleo, R M, Livi, R P, and Araujo, M.A. de.
1991.
"Crystallinity modification induced in poly(phenylene sulfide) (PPS) films by ion irradiation."
Brazil.
@misc{etde_10108394,
title = {Crystallinity modification induced in poly(phenylene sulfide) (PPS) films by ion irradiation}
author = {Rizzatti, M R, Papaleo, R M, Livi, R P, and Araujo, M.A. de}
abstractNote = {Thin PPS films (2{sub 10} {mu} thick) were bombarded with energetic {sup 1} H {sup +} (300 KeV), {sup 4} He {sup +} (380 KeV), {sup 10} B {sup +} (350 KeV) and {sup 40} Ar {sup ++} (700 KeV) ions, with fluences ranging from 10{sup 12} to 8 x 10{sup 14} ions/cm{sup 2}. The beam current density was 20 n A/cm{sup 2} in order to avoid sample heating. The modified samples were analysed by differential scanning calorimetry (DSC) and X-ray diffractometry. (author).}
place = {Brazil}
year = {1991}
month = {Dec}
}
title = {Crystallinity modification induced in poly(phenylene sulfide) (PPS) films by ion irradiation}
author = {Rizzatti, M R, Papaleo, R M, Livi, R P, and Araujo, M.A. de}
abstractNote = {Thin PPS films (2{sub 10} {mu} thick) were bombarded with energetic {sup 1} H {sup +} (300 KeV), {sup 4} He {sup +} (380 KeV), {sup 10} B {sup +} (350 KeV) and {sup 40} Ar {sup ++} (700 KeV) ions, with fluences ranging from 10{sup 12} to 8 x 10{sup 14} ions/cm{sup 2}. The beam current density was 20 n A/cm{sup 2} in order to avoid sample heating. The modified samples were analysed by differential scanning calorimetry (DSC) and X-ray diffractometry. (author).}
place = {Brazil}
year = {1991}
month = {Dec}
}