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Fine structure of parametric X radiation of relativistic electrons in crystal; Tonkaya struktura parametricheskogo rentgenovskogo izlucheniya relyativistskikh ehlektronov v kristalle

Technical Report:

Abstract

Results of experimental investigation into spectral-angular characteristics of parametric X radiation (PXR) of electrons with E{sub e}=25 MeV in a thin silicon monocrystal are considered. Comparison of the measured PGR energy orientation dependence and coherent radiation energy calculation allows one to make a conclusion about the recorded radiation coherence and the minority of contribution to spectra by bremsstrahlung diffracted in the crystal. PXR spectral line width measured agrees with the calculation according to the formula, taking account of real interval of angle of radiation recording by a detector. Effect of a series for PXR similar to series effect for coherent bremsstrahlung is considered. The form of the PXR intensity orientation dependence measured agrees with the intensity calculation by PXR kinematic theory. 14 refs.; 3 figs.
Publication Date:
Dec 31, 1989
Product Type:
Technical Report
Report Number:
KFTI-89-55
Reference Number:
SCA: 665300; PA: AIX-22:081935; SN: 91000608978
Resource Relation:
Other Information: PBD: 1989
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ELECTRON CHANNELING; MONOCRYSTALS; ANGULAR DISTRIBUTION; COHERENT RADIATION; MEV RANGE 10-100; ORIENTATION; SILICON; X-RAY SPECTRA; 665300; INTERACTIONS BETWEEN BEAMS AND CONDENSED MATTER
OSTI ID:
10105134
Research Organizations:
AN Ukrainskoj SSR, Kharkov (Ukraine). Fiziko-Tekhnicheskij Inst.
Country of Origin:
Ukraine
Language:
Russian
Other Identifying Numbers:
Other: ON: DE92609289; TRN: UA9100108081935
Availability:
OSTI; NTIS (US Sales Only); INIS
Submitting Site:
INIS
Size:
7 p.
Announcement Date:
Jun 30, 2005

Technical Report:

Citation Formats

Shchagin, A V, Pristupa, V I, and Khizhnyak, N A. Fine structure of parametric X radiation of relativistic electrons in crystal; Tonkaya struktura parametricheskogo rentgenovskogo izlucheniya relyativistskikh ehlektronov v kristalle. Ukraine: N. p., 1989. Web.
Shchagin, A V, Pristupa, V I, & Khizhnyak, N A. Fine structure of parametric X radiation of relativistic electrons in crystal; Tonkaya struktura parametricheskogo rentgenovskogo izlucheniya relyativistskikh ehlektronov v kristalle. Ukraine.
Shchagin, A V, Pristupa, V I, and Khizhnyak, N A. 1989. "Fine structure of parametric X radiation of relativistic electrons in crystal; Tonkaya struktura parametricheskogo rentgenovskogo izlucheniya relyativistskikh ehlektronov v kristalle." Ukraine.
@misc{etde_10105134,
title = {Fine structure of parametric X radiation of relativistic electrons in crystal; Tonkaya struktura parametricheskogo rentgenovskogo izlucheniya relyativistskikh ehlektronov v kristalle}
author = {Shchagin, A V, Pristupa, V I, and Khizhnyak, N A}
abstractNote = {Results of experimental investigation into spectral-angular characteristics of parametric X radiation (PXR) of electrons with E{sub e}=25 MeV in a thin silicon monocrystal are considered. Comparison of the measured PGR energy orientation dependence and coherent radiation energy calculation allows one to make a conclusion about the recorded radiation coherence and the minority of contribution to spectra by bremsstrahlung diffracted in the crystal. PXR spectral line width measured agrees with the calculation according to the formula, taking account of real interval of angle of radiation recording by a detector. Effect of a series for PXR similar to series effect for coherent bremsstrahlung is considered. The form of the PXR intensity orientation dependence measured agrees with the intensity calculation by PXR kinematic theory. 14 refs.; 3 figs.}
place = {Ukraine}
year = {1989}
month = {Dec}
}