A new approach to the interference in a plane parallel plate is introduced which is valid for any angle of incidence and any thickness. It is shown that the interference in a plate can be interpreted as the interference in a double-slit and the corresponding parameters are derived. It is also shown that for a particular angle of incidence, which depends only on the refractive index, the interfringes are minimum. It is proved theoretically and verified experimentally that the interference around this particular angle of incidence has several exploitable features which include: a) In thick plates large numbers of equidistant fringes are formed which are very adequate for producing interference gratings. b) It provides, in comparison to the conventional interferometric methods, an easier and more accurate means for direct measurement of wave-length. c) Multiple-beam interference at this particular angle improve the accuracy of the measurement of the fine structures of the atomic spectra, compared to other interferometric methods. (author). 4 refs, 4 figs.