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Dielectric properties measurement system at cryogenic temperatures and microwave frequencies; Un sistema para la medida de propiedades dielectricas a baja temperatura y frecuencia de microondas

Technical Report:

Abstract

A system based on the resonant cavity method has been developed to measure the permittivity and loss tangent at 12-18 GHz over the temperature range 80 K to 300 K. Changes of permittivity as low as 0.01% in the range 1 to 30, and 3 x 10``6 for loss tangent values below 10``2, can be obtained without requiring temperature stability. The thermal expansion coefficient and resistivity factor of copper have been measured between 80 K and 300 K. Permittivity of sapphire and loss tangent of alumina of 99,9% purity in the same temperature range are presented.
Publication Date:
Dec 01, 1994
Product Type:
Technical Report
Report Number:
CIEMAT-735
Reference Number:
SCA: 360204; 440800; PA: SPN-94:0B0786; EDB-95:015610; SN: 94001295721
Resource Relation:
Other Information: PBD: [1994]
Subject:
36 MATERIALS SCIENCE; 47 OTHER INSTRUMENTATION; DIELECTRIC PROPERTIES; MEASURING METHODS; ALUMINIUM OXIDES; PERMITTIVITY; SAPPHIRE; DIELECTRIC MATERIALS; CAVITY RESONATORS; 360204; 440800; PHYSICAL PROPERTIES; MISCELLANEOUS INSTRUMENTATION
OSTI ID:
10104695
Research Organizations:
Centro de Investigaciones Energeticas, Medioambientales y Tecnologicas (CIEMAT), Madrid (Spain)
Country of Origin:
Spain
Language:
English
Other Identifying Numbers:
Other: ON: DE95721644; TRN: ES94B0786
Availability:
OSTI; NTIS; INIS
Submitting Site:
INIS
Size:
17 p.
Announcement Date:
Jun 30, 2005

Technical Report:

Citation Formats

Molla, J, Ibarra, A, Margineda, J, Zamarro, J M, and Hernandez, A. Dielectric properties measurement system at cryogenic temperatures and microwave frequencies; Un sistema para la medida de propiedades dielectricas a baja temperatura y frecuencia de microondas. Spain: N. p., 1994. Web.
Molla, J, Ibarra, A, Margineda, J, Zamarro, J M, & Hernandez, A. Dielectric properties measurement system at cryogenic temperatures and microwave frequencies; Un sistema para la medida de propiedades dielectricas a baja temperatura y frecuencia de microondas. Spain.
Molla, J, Ibarra, A, Margineda, J, Zamarro, J M, and Hernandez, A. 1994. "Dielectric properties measurement system at cryogenic temperatures and microwave frequencies; Un sistema para la medida de propiedades dielectricas a baja temperatura y frecuencia de microondas." Spain.
@misc{etde_10104695,
title = {Dielectric properties measurement system at cryogenic temperatures and microwave frequencies; Un sistema para la medida de propiedades dielectricas a baja temperatura y frecuencia de microondas}
author = {Molla, J, Ibarra, A, Margineda, J, Zamarro, J M, and Hernandez, A}
abstractNote = {A system based on the resonant cavity method has been developed to measure the permittivity and loss tangent at 12-18 GHz over the temperature range 80 K to 300 K. Changes of permittivity as low as 0.01% in the range 1 to 30, and 3 x 10``6 for loss tangent values below 10``2, can be obtained without requiring temperature stability. The thermal expansion coefficient and resistivity factor of copper have been measured between 80 K and 300 K. Permittivity of sapphire and loss tangent of alumina of 99,9% purity in the same temperature range are presented.}
place = {Spain}
year = {1994}
month = {Dec}
}