Abstract
A system based on the resonant cavity method has been developed to measure the permittivity and loss tangent at 12-18 GHz over the temperature range 80 K to 300 K. Changes of permittivity as low as 0.01% in the range 1 to 30, and 3 x 10``6 for loss tangent values below 10``2, can be obtained without requiring temperature stability. The thermal expansion coefficient and resistivity factor of copper have been measured between 80 K and 300 K. Permittivity of sapphire and loss tangent of alumina of 99,9% purity in the same temperature range are presented.
Citation Formats
Molla, J, Ibarra, A, Margineda, J, Zamarro, J M, and Hernandez, A.
Dielectric properties measurement system at cryogenic temperatures and microwave frequencies; Un sistema para la medida de propiedades dielectricas a baja temperatura y frecuencia de microondas.
Spain: N. p.,
1994.
Web.
Molla, J, Ibarra, A, Margineda, J, Zamarro, J M, & Hernandez, A.
Dielectric properties measurement system at cryogenic temperatures and microwave frequencies; Un sistema para la medida de propiedades dielectricas a baja temperatura y frecuencia de microondas.
Spain.
Molla, J, Ibarra, A, Margineda, J, Zamarro, J M, and Hernandez, A.
1994.
"Dielectric properties measurement system at cryogenic temperatures and microwave frequencies; Un sistema para la medida de propiedades dielectricas a baja temperatura y frecuencia de microondas."
Spain.
@misc{etde_10104695,
title = {Dielectric properties measurement system at cryogenic temperatures and microwave frequencies; Un sistema para la medida de propiedades dielectricas a baja temperatura y frecuencia de microondas}
author = {Molla, J, Ibarra, A, Margineda, J, Zamarro, J M, and Hernandez, A}
abstractNote = {A system based on the resonant cavity method has been developed to measure the permittivity and loss tangent at 12-18 GHz over the temperature range 80 K to 300 K. Changes of permittivity as low as 0.01% in the range 1 to 30, and 3 x 10``6 for loss tangent values below 10``2, can be obtained without requiring temperature stability. The thermal expansion coefficient and resistivity factor of copper have been measured between 80 K and 300 K. Permittivity of sapphire and loss tangent of alumina of 99,9% purity in the same temperature range are presented.}
place = {Spain}
year = {1994}
month = {Dec}
}
title = {Dielectric properties measurement system at cryogenic temperatures and microwave frequencies; Un sistema para la medida de propiedades dielectricas a baja temperatura y frecuencia de microondas}
author = {Molla, J, Ibarra, A, Margineda, J, Zamarro, J M, and Hernandez, A}
abstractNote = {A system based on the resonant cavity method has been developed to measure the permittivity and loss tangent at 12-18 GHz over the temperature range 80 K to 300 K. Changes of permittivity as low as 0.01% in the range 1 to 30, and 3 x 10``6 for loss tangent values below 10``2, can be obtained without requiring temperature stability. The thermal expansion coefficient and resistivity factor of copper have been measured between 80 K and 300 K. Permittivity of sapphire and loss tangent of alumina of 99,9% purity in the same temperature range are presented.}
place = {Spain}
year = {1994}
month = {Dec}
}