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Trace element analysis in geochemistry using a nuclear microprobe. Ionoluminescence and particle induced X-ray emission

Abstract

In PIXE analysis of geological specimens based on X-ray detection with Si(Li) detectors, effects of detector tailing, pulse pileup, and gamma-ray production are pronounced. In this work the tailing effect has been addressed through characterization of the response function of a Si(Li) detector using an absorber technique. The pileup interval, in the pulse forming electronics of a PIXE detection system, has been improved to 100 ns X-ray energies above 8 keV by means of pulse shape analysis. Pulses due to tailing effects were also isolated but no major improvement was obtained. A means of reducing the increased background in the PIXE spectrum due to Compton scattering of high energetic gamma-rays in the Si(Li) crystal has been investigated by installation of an anti-Compton shield consisting of an organic scintillator mounted inside the detector cryostat and read out by a photomultiplier. Ionoluminescence, a new analytical technique for the nuclear microprobe, has shown to be a technique that can be employed as a fast diagnostic tool in imaging applications. The technique is based on analysis of the light that often can be observed when an ion beam impinges on a geological specimen. This light, luminescence, can often be associated with impurities in the  More>>
Authors:
Publication Date:
Aug 30, 1994
Product Type:
Thesis/Dissertation
Report Number:
LUTFD2-TFKF-1017/1-245(1994)
Reference Number:
SCA: 400101; PA: AIX-26:004612; EDB-95:008838; SN: 95001298575
Resource Relation:
Other Information: TH: Doctoral Diss. (TeknD).; PBD: 30 Aug 1994
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; GEOCHEMISTRY; TRACER TECHNIQUES; APATITES; CRYSTAL LATTICES; IMPURITIES; LUMINESCENCE; PIXE ANALYSIS; X-RAY SPECTROSCOPY; ZIRCON; 400101; ACTIVATION, NUCLEAR REACTION, RADIOMETRIC, AND RADIOCHEMICAL PROCEDURES
OSTI ID:
10102695
Research Organizations:
Lund Univ. (Sweden). Dept. of Nuclear Physics
Country of Origin:
Sweden
Language:
English
Other Identifying Numbers:
Other: ON: DE95609467; ISBN 91-628-1361-7; TRN: SE9400181004612
Availability:
OSTI; NTIS; INIS
Submitting Site:
SWDN
Size:
90 p.
Announcement Date:
Jun 30, 2005

Citation Formats

Homman, P. Trace element analysis in geochemistry using a nuclear microprobe. Ionoluminescence and particle induced X-ray emission. Sweden: N. p., 1994. Web.
Homman, P. Trace element analysis in geochemistry using a nuclear microprobe. Ionoluminescence and particle induced X-ray emission. Sweden.
Homman, P. 1994. "Trace element analysis in geochemistry using a nuclear microprobe. Ionoluminescence and particle induced X-ray emission." Sweden.
@misc{etde_10102695,
title = {Trace element analysis in geochemistry using a nuclear microprobe. Ionoluminescence and particle induced X-ray emission}
author = {Homman, P}
abstractNote = {In PIXE analysis of geological specimens based on X-ray detection with Si(Li) detectors, effects of detector tailing, pulse pileup, and gamma-ray production are pronounced. In this work the tailing effect has been addressed through characterization of the response function of a Si(Li) detector using an absorber technique. The pileup interval, in the pulse forming electronics of a PIXE detection system, has been improved to 100 ns X-ray energies above 8 keV by means of pulse shape analysis. Pulses due to tailing effects were also isolated but no major improvement was obtained. A means of reducing the increased background in the PIXE spectrum due to Compton scattering of high energetic gamma-rays in the Si(Li) crystal has been investigated by installation of an anti-Compton shield consisting of an organic scintillator mounted inside the detector cryostat and read out by a photomultiplier. Ionoluminescence, a new analytical technique for the nuclear microprobe, has shown to be a technique that can be employed as a fast diagnostic tool in imaging applications. The technique is based on analysis of the light that often can be observed when an ion beam impinges on a geological specimen. This light, luminescence, can often be associated with impurities in the crystal lattice or other structural defects. It can therefore be employed for revealing some chemical information about the specimens in contradiction to PIXE which is rather insensitive to chemical variations. The potential of the method is demonstrated and discussed both as an imaging tool and for spectroscopic studies. 19 refs, 10 figs.}
place = {Sweden}
year = {1994}
month = {Aug}
}