Systematic measurement of beta-decay half-lives of short-lived isotopes Hirose, T; Yamamoto, H; Kawade, K [Nagoya Univ. (Japan)]; Iida, T; Takahashi, A; Kasugai, Y; Ikeda, Y 66 PHYSICS; NEON 23; HALF-LIFE; SCANDIUM 50; VANADIUM 54; RUBIDIUM 84; GERMANIUM 75; SELENIUM 77; GAMMA SPECTRA; EXPERIMENTAL DATA We have measured the half-lives of short-lived isotopes for past decade and deduced the half-lives of 6 isotopes further. These results demonstrated that most of the literature values shorter than 10 min systematically deviated from our measurement ones. The cause seems to be that a large number of the previous half-life studies were performed with scintillation counters before 1970 and they had a difficulty in distinguishing the interest {gamma}-ray from the contamination and correcting for pile-up and dead-time losses. Moreover, the deviated data found to be quoted for evaluation. (author) Japan Atomic Energy Research Inst., Tokyo (Japan) OSTI as DE97758662 Japan 1997-03-01 English Technical Report Conference: 1996 symposium on nuclear data, Tokai (Japan), 21-22 Nov 1996; Other Information: PBD: Mar 1997; Related Information: Is Part Of Proceedings of the 1996 symposium on nuclear data; Iguchi, Tetsuo [Nagoya Univ. (Japan)]; Fukahori, Tokio [eds.]; PB: 332 p. Medium: X; Size: pp. 267-272 https://doi.org/ ON: DE97758662 [] JAERI-Conf-97-005; CONF-9611184-; INDC(JPN)-179/U Other: ON: DE97758662; TRN: JP9709118 JPN; SCA: 663210; PA: JPN-97:009118; EDB-97:147330; SN: 97001867022 2008-02-05 545196 https://www.osti.gov/etdeweb/servlets/purl/545196