%A"Leiby, Jr., C. C." %A"McBee, W. D." %D1963 %I; Sperry Rand Research Center, Sudbury, MA (United States) %2Sponsor not identified %J[] %KPHYSICS, ABSORPTION, ARGON, CIRCUITS, CONFIGURATION, DECAY, ELECTRONIC EQUIPMENT, ELECTRONS, ENERGY, GLOW DISCHARGES, HELIUM, LOSSES, MEASURED VALUES, MICROWAVES, NEON, NOISE, PLASMA, PRESSURE, REFLECTION, RESONANCE, TEMPERATURE %PMedium: ED; Size: Pages: 21 %TMICROWAVE NOISE MEASUREMENT OF ELECTRON TEMPERATURES IN AFTERGLOW PLASMAS %XTransient electron temperatures in afterglow plasmas were determined for He (5 and 10 torr), Ne, and Ne plus or minus 5% Ar (2.4 and 24 torr) by combining measurements of plasma microwave noise power, and plasma reflectivity and absorptivity. Use of a low-noise parametric preamplifier permitted continuous detection during the afterglow of noise power at 5.5 Bc in a 1 Mc bandwidth. Electron temperature decays were a function of pressure and gas but were slower than predicted by electron energy loss mechanisms. The addition of argon altered the electron density decay in the neon afterglow but the electron temperature decay was not appreciably changed. Resonances in detected noise power vs time in the afterglow were observed for two of the three plasma waveguide geometries studied. These resonances correlate with observed resonances in absorptivity and occur over the same range of electron densities for a given geometry independent of gas type and pressure. (auth) %0Conference %NCONF-364-2; AED-Conf-62-195-2; %1 %CUnited States %Rhttps://doi.org/ DTIE %GEnglish