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	  <record>
	       <dc:title>Next generation V{sub 2}O{sub 5} cathode materials for Li rechargeable batteries</dc:title>
	       <dc:creator>McGraw, J M [Colorado School of Mines, Golden, Colorado 80401 (United States)]; Perkins, J D; Zhang, J -G; Liu, P; Parilla, P A; Turner, J; Schulz, D L; Curtis, C J; Ginley, D S [National Renewable Energy Laboratory, Golden, Colorado 80401 (United States)]</dc:creator>
	       <dc:subject>25 ENERGY STORAGE; VANADIUM OXIDES; CATHODES; ELECTRIC BATTERIES; LITHIUM IONS; THIN FILMS; TEXTURE; AMORPHOUS STATE; CHEMICAL VAPOR DEPOSITION; CAPACITY; STABILITY; STRUCTURE FACTORS</dc:subject>
	       <dc:subjectRelated></dc:subjectRelated>
	       <dc:description>We report on investigations of vanadium oxide thin film cathodes prepared by three different synthesis techniques. Our experimental results on PLD-grown, textured V{sub 2}O{sub 5} crystalline films concur with reports in the literature that there is a voltage threshold above which, cycling appears to be completely reversible and below which, cycling appears to be irreversible. Crystalline films discharged beyond the threshold to 2.0 V exhibited an immediate and continuous fade in capacity as well as a nearly 90% decrease in XRD peak intensity and a similar decrease in Raman signal intensity in as few as ten cycles. PLD-grown amorphous films show capacity loss of <2% over 200 cycles. Amorphous plasma-enhanced chemical vapor deposition (PECVD) films have capacities as high as 1.5 Li/V with excellent stability over 3000 cycles. Solution-grown nanoparticles (<100 nm) of VO{sub 2} were spray-deposited and sintered at relatively low temperatures to produce nanoporous films. Cycling properties along with structural investigations by XRD and Raman scattering will be presented</dc:description>
	       <dcq:publisher></dcq:publisher>
	       <dcq:publisherResearch></dcq:publisherResearch>
	       <dcq:publisherAvailability></dcq:publisherAvailability>
	       <dcq:publisherSponsor></dcq:publisherSponsor>
	       <dcq:publisherCountry>Netherlands</dcq:publisherCountry>
		   <dc:contributingOrganizations></dc:contributingOrganizations>
	       <dc:date>1998-12-01</dc:date>
	       <dc:language>English</dc:language>
	       <dc:type>Journal Article</dc:type>
	       <dcq:typeQualifier></dcq:typeQualifier>
	       <dc:relation>Journal Name: Solid State Ionics; Journal Volume: 113-115; Journal Issue: 1-4; Other Information: PBD: 1 Dec 1998</dc:relation>
	       <dc:coverage></dc:coverage>
	       <dc:format>Medium: X; Size: pp. 407-413</dc:format>
	       <dc:doi>https://doi.org/10.1016/S0167-2738(98)00383-X</dc:doi>
	       <dc:identifier></dc:identifier>
		   <dc:journalName>[]</dc:journalName>
		   <dc:journalIssue>1-4</dc:journalIssue>
		   <dc:journalVolume>113-115</dc:journalVolume>
	       <dc:identifierReport></dc:identifierReport>
	       <dcq:identifierDOEcontract></dcq:identifierDOEcontract>
	       <dc:identifierOther>Journal ID: SSIOD3; ISSN 0167-2738; TRN: NL99E0410</dc:identifierOther>
	       <dc:source>ECN; SCA: 250903; PA: ECN-99:0E0410; EDB-99:014399; SN: 99002054618</dc:source>
	       <dc:rights></dc:rights>
	       <dc:dateEntry>2010-12-29</dc:dateEntry>
	       <dc:dateAdded></dc:dateAdded>
	       <dc:ostiId>302630</dc:ostiId>
	       <dcq:identifier-purl></dcq:identifier-purl>
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