Advances in silicon carbide X-ray detectors Bertuccio, Giuseppe [Politecnico di Milano, Department of Electronics Engineering and Information Science, Como Campus, Via Anzani 42, 22100 Como (Italy)]; National Institute of Nuclear Physics, INFN sez. Milano (Italy)]; Caccia, Stefano [Politecnico di Milano, Department of Electronics Engineering and Information Science, Como Campus, Via Anzani 42, 22100 Como (Italy)]; Puglisi, Donatella; Macera, Daniele [Politecnico di Milano, Department of Electronics Engineering and Information Science, Como Campus, Via Anzani 42, 22100 Como (Italy)]; National Institute of Nuclear Physics, INFN sez. Milano (Italy)] 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; EV RANGE; FANO FACTOR; IRON 55; NOISE; RADIATION DETECTORS; SEMICONDUCTOR MATERIALS; SILICON CARBIDES; STABILIZATION; X RADIATION; X-RAY SPECTRA; X-RAY SPECTROSCOPY The latest advances in SiC X-ray detectors are presented: a pixel detector coupled to a custom ultra low noise CMOS preamplifier has been characterized at room and high temperature. An equivalent noise energy (ENE) of 113 eV FWHM, corresponding to 6.1 electrons r.m.s., has been achieved with the detector/front-end system operating at +30 {sup o}C. A Fano factor of F=0.10 has been estimated from the {sup 55}Fe spectrum. When the system is heated up to +100 {sup o}C, the measured ENE is 163 eV FWHM (8.9 electrons r.m.s.). It is determined that both at room and at high temperature the performance are fully limited by the noise of the front-end electronics. It is also presented the capability of SiC detectors to operate in environments under unstable temperature conditions without any apparatus for temperature stabilization; it has been proved that a SiC detector can acquire high resolution X-ray spectra without spectral line degradation while the system temperature changes between +30 and +75 {sup o}C. Available from http://dx.doi.org/10.1016/j.nima.2010.08.046 Netherlands 2011-10-01 English Journal Article Conference Journal Name: Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment; Journal Volume: 652; Journal Issue: 1; Conference: 12. Symposium on radiation measurements and applications (SORMA), Ann Arbor, MI (United States), 24-28 May 2010; Other Information: Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA) Medium: X; Size: page(s) 193-196 https://doi.org/10.1016/J.NIMA.2010.08.046 PII: S0168-9002(10)01820-6 [] 1 652 Journal ID: ISSN 0168-9002; CODEN: NIMAER; Other: PII: S0168-9002(10)01820-6; TRN: NL12R5549001803 NLN 2013-04-12 22042350