{
  "date" : "2010-11-15",
  "identifier_doecontract" : "",
  "subject" : "36 MATERIALS SCIENCE; ADVANCED LIGHT SOURCE; CHARGE-COUPLED DEVICES; HARD X RADIATION; NEUTRON DIFFRACTION; POLARIZATION; POLYMERS; SENSITIVITY; SOFT X RADIATION; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATION SOURCES; RADIATIONS; SCATTERING; SEMICONDUCTOR DEVICES; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; X RADIATION",
  "description" : "Most advanced applications of polymers rely on heterogeneous structures or specific interfacial properties to yield desired performance and functionalities. Rational design and application require that these structures be characterized. Recently, it has been demonstrated that soft x-ray scattering is a unique complementary technique to conventional hard x-ray and neutron scattering and an excellent tool for polymer structure determination with improved chemical sensitivity. Efforts to enhance the capabilities and efficiency of soft x-ray scattering through the use of a CCD detector will be delineated and first results presented. Development of a dedicated setup at beamline 11.0.1.2 of the Advanced Light Source will be described. This set-up has an elliptically polarized undulator as a source, which offers complete polarization control and hence unique capabilities.",
  "language" : "English",
  "identifier_report" : "",
  "publisher_sponsor" : "",
  "publisher_country" : "United Kingdom",
  "source" : "GBN",
  "purl" : "",
  "title" : "Resonant Soft X-ray Scattering of Polymers with a 2D Detector: Initial Results and System Developments at the Advanced Light Source",
  "type" : "Journal Article",
  "subject_related" : "COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATION SOURCES; RADIATIONS; SCATTERING; SEMICONDUCTOR DEVICES; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; X RADIATION",
  "relation" : "Journal Name: IOP Conference Series. Materials Science and Engineering (Online); Journal Volume: 14; Journal Issue: 1; Conference: SRPS 4: Synchrotron Radiation in Polymer Science, Kerkrade (Netherlands), 8-11 Sep 2009; Other Information: DOI: 10.1088/1757-899X/14/1/012016",
  "entry_date" : "2012-12-06",
  "subject_list" : [ "36 MATERIALS SCIENCE", "ADVANCED LIGHT SOURCE", "CHARGE-COUPLED DEVICES", "HARD X RADIATION", "NEUTRON DIFFRACTION", "POLARIZATION", "POLYMERS", "SENSITIVITY", "SOFT X RADIATION", "COHERENT SCATTERING", "DIFFRACTION", "ELECTROMAGNETIC RADIATION", "IONIZING RADIATIONS", "RADIATION SOURCES", "RADIATIONS", "SCATTERING", "SEMICONDUCTOR DEVICES", "STORAGE RINGS", "SYNCHROTRON RADIATION SOURCES", "X RADIATION" ],
  "publisher_availability" : "Available from http://dx.doi.org/10.1088/1757-899X/14/1/012016",
  "rights" : "",
  "announced_date" : "2012-03-29",
  "type_qualifier" : "",
  "has_fulltext" : false,
  "coverage" : "",
  "identifier" : "",
  "journal_volume" : "14",
  "creator" : "Wang, C; Hexemer, A; Nasiatka, J; Chan, E R; Young, A T; Padmore, H A; Schlotter, W F; Luening, J; Swaraj, S; Watts, B; Gann, E; Yan, H; Ade, H",
  "site_ownership_code" : "GBN",
  "osti_id" : "21540746",
  "journal_issue" : "1",
  "resource_type" : "JOUR",
  "format" : "Medium: X; Size: 7 pages",
  "journal_name" : [ ],
  "contributing_organizations" : "",
  "citation_location" : "https://www.osti.gov/etdeweb/biblio/21540746",
  "publication_year" : 2010,
  "subject_list_commas" : "36 MATERIALS SCIENCE, ADVANCED LIGHT SOURCE, CHARGE-COUPLED DEVICES, HARD X RADIATION, NEUTRON DIFFRACTION, POLARIZATION, POLYMERS, SENSITIVITY, SOFT X RADIATION, COHERENT SCATTERING, DIFFRACTION, ELECTROMAGNETIC RADIATION, IONIZING RADIATIONS, RADIATION SOURCES, RADIATIONS, SCATTERING, SEMICONDUCTOR DEVICES, STORAGE RINGS, SYNCHROTRON RADIATION SOURCES, X RADIATION",
  "publisher" : "",
  "identifier_other" : "Journal ID: ISSN 1757-899X; TRN: GB12P7169019950",
  "publisher_research" : "",
  "creators_list" : [ "Wang, C", "Hexemer, A", "Nasiatka, J", "Chan, E R", "Young, A T", "Padmore, H A", "Schlotter, W F", "Luening, J", "Swaraj, S", "Watts, B", "Gann, E", "Yan, H", "Ade, H" ],
  "doi" : "https://doi.org/10.1088/1757-899X/14/1/012016"
}