"TITLE","AUTHORS","SUBJECT","SUBJECT_RELATED","DESCRIPTION","PUBLISHER","AVAILABILITY","RESEARCH_ORG","SPONSORING_ORG","PUBLICATION_COUNTRY","PUBLICATION_DATE","CONTRIBUTING_ORGS","LANGUAGE","RESOURCE_TYPE","TYPE_QUALIFIER","JOURNAL_ISSUE","JOURNAL_VOLUME","RELATION","COVERAGE","FORMAT","IDENTIFIER","REPORT_NUMBER","DOE_CONTRACT_NUMBER","OTHER_IDENTIFIER","DOI","RIGHTS","ENTRY_DATE","OSTI_IDENTIFIER","PURL_URL" "Protons and heavy ions induced stuck bits on large capacity RAMs","Duzellier, S; Falguere, D; Ecoffet, R [Centre National d`Etudes Spatiales (CNES), 31 - Toulouse (France)]","44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; INTEGRATED CIRCUITS; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR STORAGE DEVICES; ANNEALING; BROMINE; BURNOUT; CARBON; CARRIER LIFETIME; CHLORINE; COBALT 60; DIFFERENTIAL CROSS SECTIONS; ERRORS; EXPERIMENTAL DATA; FAILURES; FLUORINE; GAMMA RADIATION; HEAVY IONS; IODINE; KRYPTON; LET; LITHIUM; MAGNESIUM; NICKEL; ORSAY TANDEM ACCELERATOR; OXYGEN; PROBABILITY; PROTON BEAMS; PROTONS; PULSED IRRADIATION; SATURNE; SPACE DEPENDENCE","","A semi-permanent imprint effect has been observed, on large capacity memories (static and dynamic), during heavy ion and proton irradiations. The experimental circumstances of stuck bits occurrence are described and the influence of irradiation conditions discussed. A total dose testing complete the investigation. (author). 10 refs., 5 figs., 3 tabs.","Commissariat a l`Energie Atomique, Bruyeres-le-Chatel (France)","","CEA Centre d`Etudes de Bruyeres-le-Chatel, 91 (France)","","France","1994-12-31","","English","Book","","","","Conference: Symposium on radiations and their effects on components and systems, Saint-Malo (France), 13 Sep 1993; Other Information: PBD: 1994; Related Information: Is Part Of Radiation and its effects on components and systems; PB: 596 p.","","Medium: X; Size: pp. 468-472","","CONF-9309349-","","TRN: FR9502556008818","https://doi.org/","","2008-02-04","182359",""