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	       <dc:title>Profile constraining mechanism for T{sub e} profile invariance in tokamaks</dc:title>
	       <dc:creator>Becker, G</dc:creator>
	       <dc:subject>70 PLASMA PHYSICS AND FUSION TECHNOLOGY; TOKAMAK DEVICES; ELECTRON TEMPERATURE; THERMAL DIFFUSIVITY; ELECTRONS; ELECTRON DENSITY; SCALING LAWS; SPATIAL DISTRIBUTION; JOULE HEATING; 700410; SPECIFIC FUSION DEVICES AND EXPERIMENTS</dc:subject>
	       <dc:subjectRelated></dc:subjectRelated>
	       <dc:description>A new model for the electron temperature profile resilience in the outer half of tokamak plasmas is proposed and investigated. It is shown that introducing a negative feedback term into the scaling of the electron heat diffusivity {chi}{sub e}(r) = {chi}{sub ee}(r)(1-{alpha}a{sup 2}/T{sub eo} d{sup 2}T{sub e}/dr{sup 2}) with {alpha} > or {approx} 3 results in the observed T{sub e} profile stiffness against variations of the density and heating profiles. In addition, the feedback by itself yields the measured approximately linear T{sub e}(r) shape for r/a > or {approx} 0.5 in contrast to previous profile constraining models. (orig.). 6 figs.</dc:description>
	       <dcq:publisher></dcq:publisher>
	       <dcq:publisherResearch>Max-Planck-Institut fuer Plasmaphysik, Garching (Germany)</dcq:publisherResearch>
	       <dcq:publisherAvailability>OSTI; NTIS (US Sales Only); INIS</dcq:publisherAvailability>
	       <dcq:publisherSponsor></dcq:publisherSponsor>
	       <dcq:publisherCountry>Germany</dcq:publisherCountry>
		   <dc:contributingOrganizations></dc:contributingOrganizations>
	       <dc:date>1993-03-01</dc:date>
	       <dc:language>English</dc:language>
	       <dc:type>Technical Report</dc:type>
	       <dcq:typeQualifier></dcq:typeQualifier>
	       <dc:relation>Other Information: PBD: Mar 1993</dc:relation>
	       <dc:coverage></dc:coverage>
	       <dc:format>Medium: X; Size: 14 p.</dc:format>
	       <dc:doi>https://doi.org/</dc:doi>
	       <dc:identifier>ON: DE94733999</dc:identifier>
		   <dc:journalName>[]</dc:journalName>
		   <dc:journalIssue></dc:journalIssue>
		   <dc:journalVolume></dc:journalVolume>
	       <dc:identifierReport>IPP-5/51</dc:identifierReport>
	       <dcq:identifierDOEcontract></dcq:identifierDOEcontract>
	       <dc:identifierOther>Other: ON: DE94733999; TRN: DE94F0658</dc:identifierOther>
	       <dc:source>DEN; SCA: 700410; PA: DEN-94:0F0658; EDB-94:027907; ERA-19:007878; NTS-94:015644; SN: 94001136105</dc:source>
	       <dc:rights></dc:rights>
	       <dc:dateEntry>2008-02-12</dc:dateEntry>
	       <dc:dateAdded></dc:dateAdded>
	       <dc:ostiId>10119781</dc:ostiId>
	       <dcq:identifier-purl></dcq:identifier-purl>
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