%AEastoe, J
%APenfold, J
%D1992
%I; Rutherford Appleton Lab., Chilton (United Kingdom)
%J
%K73 NUCLEAR PHYSICS AND RADIATION PHYSICS, NEUTRON REFLECTORS, THIN FILMS, NEUTRONS, REFLECTIVITY, ACCURACY, CALCULATION METHODS, COMPARATIVE EVALUATIONS, EXPERIMENTAL DATA, LAYERS, REFLECTIVE COATINGS, 663610, NEUTRON PHYSICS
%PMedium: X; Size: [24] p.
%TComparison of kinematic and optical matrix methods for calculating reflectivity profiles of solid thin films and multilayers
%XA comparison of the calculation of neutron reflectivity profiles R(Q) by optical matrix methods and a multilayer method, based on the kinematic approximation, has been made. The latter method provides a fast simple route to calculating R(Q) and may be used with confidence for systems of total thickness {<=}200 ``A`` for a scattering length density difference ``Delta`` of the order of 1.0 x 10{sup -5} A {sup -2}. For thicker layers the approximation is poor and the optical matrix method must be used for an accurate evaluation of such reflectivity data over a wide Q range. (author).
%0Technical Report
United Kingdom Other: ON: DE93610133; TRN: GB9203061003926 GBN English