Fine structure of parametric X radiation of relativistic electrons in crystal; Tonkaya struktura parametricheskogo rentgenovskogo izlucheniya relyativistskikh ehlektronov v kristalle
Shchagin, A V; Pristupa, V I; Khizhnyak, N A
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ELECTRON CHANNELING; MONOCRYSTALS; ANGULAR DISTRIBUTION; COHERENT RADIATION; MEV RANGE 10-100; ORIENTATION; SILICON; X-RAY SPECTRA; 665300; INTERACTIONS BETWEEN BEAMS AND CONDENSED MATTER
Results of experimental investigation into spectral-angular characteristics of parametric X radiation (PXR) of electrons with E{sub e}=25 MeV in a thin silicon monocrystal are considered. Comparison of the measured PGR energy orientation dependence and coherent radiation energy calculation allows one to make a conclusion about the recorded radiation coherence and the minority of contribution to spectra by bremsstrahlung diffracted in the crystal. PXR spectral line width measured agrees with the calculation according to the formula, taking account of real interval of angle of radiation recording by a detector. Effect of a series for PXR similar to series effect for coherent bremsstrahlung is considered. The form of the PXR intensity orientation dependence measured agrees with the intensity calculation by PXR kinematic theory. 14 refs.; 3 figs.
AN Ukrainskoj SSR, Kharkov (Ukraine). Fiziko-Tekhnicheskij Inst.
OSTI; NTIS (US Sales Only); INIS
Ukraine
1990-12-31
Russian
Technical Report
Other Information: PBD: 1989
Medium: X; Size: 7 p.
ON: DE92609289
KFTI-89-55
Other: ON: DE92609289; TRN: UA9100108081935
INIS; SCA: 665300; PA: AIX-22:081935; SN: 91000608978
2008-02-12
10105134