%AShchagin, A V
%APristupa, V I
%AKhizhnyak, N A
%D1989
%I; AN Ukrainskoj SSR, Kharkov (Ukraine). Fiziko-Tekhnicheskij Inst.
%J
%K75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY, ELECTRON CHANNELING, MONOCRYSTALS, ANGULAR DISTRIBUTION, COHERENT RADIATION, MEV RANGE 10-100, ORIENTATION, SILICON, X-RAY SPECTRA, 665300, INTERACTIONS BETWEEN BEAMS AND CONDENSED MATTER
%PMedium: X; Size: 7 p.
%TFine structure of parametric X radiation of relativistic electrons in crystal; Tonkaya struktura parametricheskogo rentgenovskogo izlucheniya relyativistskikh ehlektronov v kristalle
%XResults of experimental investigation into spectral-angular characteristics of parametric X radiation (PXR) of electrons with E{sub e}=25 MeV in a thin silicon monocrystal are considered. Comparison of the measured PGR energy orientation dependence and coherent radiation energy calculation allows one to make a conclusion about the recorded radiation coherence and the minority of contribution to spectra by bremsstrahlung diffracted in the crystal. PXR spectral line width measured agrees with the calculation according to the formula, taking account of real interval of angle of radiation recording by a detector. Effect of a series for PXR similar to series effect for coherent bremsstrahlung is considered. The form of the PXR intensity orientation dependence measured agrees with the intensity calculation by PXR kinematic theory. 14 refs.; 3 figs.
%0Technical Report
Ukraine Other: ON: DE92609289; TRN: UA9100108081935 INIS Russian