Photothermal imaging scanning microscopy
Abstract
Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.
- Inventors:
-
- Pleasanton, CA
- Lathrop, CA
- Discovery Bay, CA
- Tracy, CA
- Issue Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 908346
- Patent Number(s):
- 7075058
- Application Number:
- 10/402,604
- Assignee:
- The United States of America as represented by the United States Department of Energy (Washington, DC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Chinn, Diane, Stolz, Christopher J, Wu, Zhouling, Huber, Robert, and Weinzapfel, Carolyn. Photothermal imaging scanning microscopy. United States: N. p., 2006.
Web.
Chinn, Diane, Stolz, Christopher J, Wu, Zhouling, Huber, Robert, & Weinzapfel, Carolyn. Photothermal imaging scanning microscopy. United States.
Chinn, Diane, Stolz, Christopher J, Wu, Zhouling, Huber, Robert, and Weinzapfel, Carolyn. Tue .
"Photothermal imaging scanning microscopy". United States. https://www.osti.gov/servlets/purl/908346.
@article{osti_908346,
title = {Photothermal imaging scanning microscopy},
author = {Chinn, Diane and Stolz, Christopher J and Wu, Zhouling and Huber, Robert and Weinzapfel, Carolyn},
abstractNote = {Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jul 11 00:00:00 EDT 2006},
month = {Tue Jul 11 00:00:00 EDT 2006}
}
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