Ceramic capacitor exhibiting graceful failure by self-clearing, method for fabricating self-clearing capacitor
Abstract
A short-resistant capacitor comprises an electrically conductive planar support substrate having a first thickness, a ceramic film deposited over the support substrate, thereby defining a ceramic surface; and a metallic film deposited over the ceramic surface, said film having a second thickness which is less than the first thickness and which is between 0.01 and 0.1 microns.
- Inventors:
-
- Chicago, IL
- Santa Clara, CA
- Issue Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 908267
- Patent Number(s):
- 7099141
- Application Number:
- 11/145,220
- Assignee:
- The United States of America as represented by the United States Department of Energy (Washington, DC)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01G - CAPACITORS
- DOE Contract Number:
- W-31109-ENG-38
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Kaufman, David Y, and Saha, Sanjib. Ceramic capacitor exhibiting graceful failure by self-clearing, method for fabricating self-clearing capacitor. United States: N. p., 2006.
Web.
Kaufman, David Y, & Saha, Sanjib. Ceramic capacitor exhibiting graceful failure by self-clearing, method for fabricating self-clearing capacitor. United States.
Kaufman, David Y, and Saha, Sanjib. Tue .
"Ceramic capacitor exhibiting graceful failure by self-clearing, method for fabricating self-clearing capacitor". United States. https://www.osti.gov/servlets/purl/908267.
@article{osti_908267,
title = {Ceramic capacitor exhibiting graceful failure by self-clearing, method for fabricating self-clearing capacitor},
author = {Kaufman, David Y and Saha, Sanjib},
abstractNote = {A short-resistant capacitor comprises an electrically conductive planar support substrate having a first thickness, a ceramic film deposited over the support substrate, thereby defining a ceramic surface; and a metallic film deposited over the ceramic surface, said film having a second thickness which is less than the first thickness and which is between 0.01 and 0.1 microns.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Aug 29 00:00:00 EDT 2006},
month = {Tue Aug 29 00:00:00 EDT 2006}
}
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