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Title: Intra-Cavity Total Reflection For High Sensitivity Measurement Of Optical Properties

Abstract

An optical cavity resonator device is provided for conducting sensitive murement of optical absorption by matter in any state with diffraction-limited spatial resolution through utilization of total internal reflection within a high-Q (high quality, low loss) optical cavity. Intracavity total reflection generates an evanescent wave that decays exponentially in space at a point external to the cavity, thereby providing a localized region where absorbing materials can be sensitively probed through alteration of the Q-factor of the otherwise isolated cavity. When a laser pulse is injected into the cavity and passes through the evanescent state, an amplitude loss resulting from absorption is incurred that reduces the lifetime of the pulse in the cavity. By monitoring the decay of the injected pulse, the absorption coefficient of manner within the evanescent wave region is accurately obtained from the decay time measurement.

Inventors:
 [1];  [2]
  1. Gaithersburg, MD
  2. Rockville, MD
Issue Date:
Research Org.:
DEPARTMENT OF COMMERCE
OSTI Identifier:
879724
Patent Number(s):
5943136
Application Number:
09/962170
Assignee:
The United States of America as represented by the Secretary of Commerce (Washington, DC)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
AI07-97ER62518
Resource Type:
Patent
Country of Publication:
United States
Language:
English

Citation Formats

Pipino, Andrew C. R., and Hudgens, Jeffrey W. Intra-Cavity Total Reflection For High Sensitivity Measurement Of Optical Properties. United States: N. p., 1999. Web.
Pipino, Andrew C. R., & Hudgens, Jeffrey W. Intra-Cavity Total Reflection For High Sensitivity Measurement Of Optical Properties. United States.
Pipino, Andrew C. R., and Hudgens, Jeffrey W. Tue . "Intra-Cavity Total Reflection For High Sensitivity Measurement Of Optical Properties". United States. https://www.osti.gov/servlets/purl/879724.
@article{osti_879724,
title = {Intra-Cavity Total Reflection For High Sensitivity Measurement Of Optical Properties},
author = {Pipino, Andrew C. R. and Hudgens, Jeffrey W},
abstractNote = {An optical cavity resonator device is provided for conducting sensitive murement of optical absorption by matter in any state with diffraction-limited spatial resolution through utilization of total internal reflection within a high-Q (high quality, low loss) optical cavity. Intracavity total reflection generates an evanescent wave that decays exponentially in space at a point external to the cavity, thereby providing a localized region where absorbing materials can be sensitively probed through alteration of the Q-factor of the otherwise isolated cavity. When a laser pulse is injected into the cavity and passes through the evanescent state, an amplitude loss resulting from absorption is incurred that reduces the lifetime of the pulse in the cavity. By monitoring the decay of the injected pulse, the absorption coefficient of manner within the evanescent wave region is accurately obtained from the decay time measurement.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Aug 24 00:00:00 EDT 1999},
month = {Tue Aug 24 00:00:00 EDT 1999}
}