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Title: Enhanced modified faraday cup for determination of power density distribution of electron beams

Abstract

An improved tomographic technique for determining the power distribution of an electron or ion beam using electron beam profile data acquired by an enhanced modified Faraday cup to create an image of the current density in high and low power ion or electron beams. A refractory metal disk with a number of radially extending slits, one slit being about twice the width of the other slits, is placed above a Faraday cup. The electron or ion beam is swept in a circular pattern so that its path crosses each slit in a perpendicular manner, thus acquiring all the data needed for a reconstruction in one circular sweep. The enlarged slit enables orientation of the beam profile with respect to the coordinates of the welding chamber. A second disk having slits therein is positioned below the first slit disk and inside of the Faraday cup and provides a shield to eliminate the majority of secondary electrons and ions from leaving the Faraday cup. Also, a ring is located below the second slit disk to help minimize the amount of secondary electrons and ions from being produced. In addition, a beam trap is located in the Faraday cup to provide even moremore » containment of the electron or ion beam when full beam current is being examined through the center hole of the modified Faraday cup.

Inventors:
 [1];  [2]
  1. Danville, CA
  2. Livermore, CA
Issue Date:
Research Org.:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
OSTI Identifier:
874046
Patent Number(s):
6300755
Assignee:
Regents of University of California (Oakland, CA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
enhanced; modified; faraday; cup; determination; power; density; distribution; electron; beams; improved; tomographic; technique; determining; beam; profile; data; acquired; create; image; current; refractory; metal; disk; radially; extending; slits; slit; twice; width; placed; swept; circular; pattern; path; crosses; perpendicular; manner; acquiring; reconstruction; sweep; enlarged; enables; orientation; respect; coordinates; welding; chamber; therein; positioned; below; inside; provides; shield; eliminate; majority; secondary; electrons; leaving; located; help; minimize; amount; produced; addition; trap; provide; containment; examined; center; positioned below; located below; profile data; data acquired; tomographic technique; beam current; current density; refractory metal; electron beam; electron beams; radially extending; faraday cup; power density; density distribution; secondary electrons; power distribution; beam profile; modified faraday; secondary electron; beam trap; perpendicular manner; circular pattern; metal disk; /324/

Citation Formats

Elmer, John W, and Teruya, Alan T. Enhanced modified faraday cup for determination of power density distribution of electron beams. United States: N. p., 2001. Web.
Elmer, John W, & Teruya, Alan T. Enhanced modified faraday cup for determination of power density distribution of electron beams. United States.
Elmer, John W, and Teruya, Alan T. Mon . "Enhanced modified faraday cup for determination of power density distribution of electron beams". United States. https://www.osti.gov/servlets/purl/874046.
@article{osti_874046,
title = {Enhanced modified faraday cup for determination of power density distribution of electron beams},
author = {Elmer, John W and Teruya, Alan T},
abstractNote = {An improved tomographic technique for determining the power distribution of an electron or ion beam using electron beam profile data acquired by an enhanced modified Faraday cup to create an image of the current density in high and low power ion or electron beams. A refractory metal disk with a number of radially extending slits, one slit being about twice the width of the other slits, is placed above a Faraday cup. The electron or ion beam is swept in a circular pattern so that its path crosses each slit in a perpendicular manner, thus acquiring all the data needed for a reconstruction in one circular sweep. The enlarged slit enables orientation of the beam profile with respect to the coordinates of the welding chamber. A second disk having slits therein is positioned below the first slit disk and inside of the Faraday cup and provides a shield to eliminate the majority of secondary electrons and ions from leaving the Faraday cup. Also, a ring is located below the second slit disk to help minimize the amount of secondary electrons and ions from being produced. In addition, a beam trap is located in the Faraday cup to provide even more containment of the electron or ion beam when full beam current is being examined through the center hole of the modified Faraday cup.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 2001},
month = {Mon Jan 01 00:00:00 EST 2001}
}

Works referenced in this record:

Fast method for measuring power density distribution of non-circular and irregular electron beams
journal, April 1998