DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Apparatus and method for sensing motion in a microelectro-mechanical system

Abstract

An apparatus and method are disclosed for optically sensing motion in a microelectromechanical system (also termed a MEMS device) formed by surface micromachining or LIGA. The apparatus operates by reflecting or scattering a light beam off a corrugated surface (e.g. gear teeth or a reference feature) of a moveable member (e.g. a gear, rack or linkage) within the MEMS device and detecting the reflected or scattered light. The apparatus can be used to characterize a MEMS device, measuring one or more performance characteristic such as spring and damping coefficients, torque and friction, or uniformity of motion of the moveable member. The apparatus can also be used to determine the direction and extent of motion of the moveable member; or to determine a particular mechanical state that a MEMS device is in. Finally, the apparatus and method can be used for providing feedback to the MEMS device to improve performance and reliability.

Inventors:
 [1];  [1]
  1. Albuquerque, NM
Issue Date:
Research Org.:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
OSTI Identifier:
872691
Patent Number(s):
5990473
Assignee:
Sandia Corporation (Albuquerque, NM)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01D - MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
apparatus; method; sensing; motion; microelectro-mechanical; disclosed; optically; microelectromechanical; termed; mems; device; formed; surface; micromachining; liga; operates; reflecting; scattering; light; beam; corrugated; gear; teeth; reference; feature; moveable; rack; linkage; detecting; reflected; scattered; characterize; measuring; performance; characteristic; spring; damping; coefficients; torque; friction; uniformity; determine; direction; extent; particular; mechanical; finally; providing; feedback; improve; reliability; gear teeth; scattered light; light beam; surface micromachining; mems device; improve performance; sensing motion; performance characteristic; /250/

Citation Formats

Dickey, Fred M, and Holswade, Scott C. Apparatus and method for sensing motion in a microelectro-mechanical system. United States: N. p., 1999. Web.
Dickey, Fred M, & Holswade, Scott C. Apparatus and method for sensing motion in a microelectro-mechanical system. United States.
Dickey, Fred M, and Holswade, Scott C. Fri . "Apparatus and method for sensing motion in a microelectro-mechanical system". United States. https://www.osti.gov/servlets/purl/872691.
@article{osti_872691,
title = {Apparatus and method for sensing motion in a microelectro-mechanical system},
author = {Dickey, Fred M and Holswade, Scott C},
abstractNote = {An apparatus and method are disclosed for optically sensing motion in a microelectromechanical system (also termed a MEMS device) formed by surface micromachining or LIGA. The apparatus operates by reflecting or scattering a light beam off a corrugated surface (e.g. gear teeth or a reference feature) of a moveable member (e.g. a gear, rack or linkage) within the MEMS device and detecting the reflected or scattered light. The apparatus can be used to characterize a MEMS device, measuring one or more performance characteristic such as spring and damping coefficients, torque and friction, or uniformity of motion of the moveable member. The apparatus can also be used to determine the direction and extent of motion of the moveable member; or to determine a particular mechanical state that a MEMS device is in. Finally, the apparatus and method can be used for providing feedback to the MEMS device to improve performance and reliability.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Jan 01 00:00:00 EST 1999},
month = {Fri Jan 01 00:00:00 EST 1999}
}

Works referenced in this record:

Surface micromachined microengine
journal, May 1995


Ultrafine motion detection of micromechanical structures using optical moire patterns
journal, August 1996


Polymer waveguide cointegration with microelectromechanical systems (MEMS) for integrated optical metrology
conference, March 1998


LIGA-microtesting system with integrated strain gauges for force measurement
conference, January 1997

  • Ruther, P.; Bacher, W.; Feit, K.
  • Proceedings IEEE The Tenth Annual International Workshop on Micro Electro Mechanical Systems. An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots
  • https://doi.org/10.1109/MEMSYS.1997.581924

Microjet printing of micro-optical waveguides
conference, January 1996


Micro torque measurements for a prototype turbine
journal, September 1994


Modeling an optical micromachine probe
conference, December 1997


Surface-micromachined diffraction gratings for scanning spectroscopic applications
conference, August 2002


Optical measurement of LIGA milliengine performance
conference, March 1998


Polymer guided-wave integrated optics: an enabling technology for micro-opto-electro-mechanical systems
conference, April 1997


In situ friction and wear measurements in integrated polysilicon mechanisms
journal, February 1990


Optical micro encoder using a twin-beam VCSEL with integrated microlenses
conference, January 1997


Optical probe for micromachine performance analysis
conference, April 1997


Friction in surface-micromachined microengines
conference, May 1996


Optical measurement of micromachine engine performance
conference, September 1997


Optical methods for characterization of MEMS device motion
conference, September 1995