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Title: Method and apparatus for digitally based high speed x-ray spectrometer

Abstract

A high speed, digitally based, signal processing system which accepts input data from a detector-preamplifier and produces a spectral analysis of the x-rays illuminating the detector. The system achieves high throughputs at low cost by dividing the required digital processing steps between a "hardwired" processor implemented in combinatorial digital logic, which detects the presence of the x-ray signals in the digitized data stream and extracts filtered estimates of their amplitudes, and a programmable digital signal processing computer, which refines the filtered amplitude estimates and bins them to produce the desired spectral analysis. One set of algorithms allow this hybrid system to match the resolution of analog systems while operating at much higher data rates. A second set of algorithms implemented in the processor allow the system to be self calibrating as well. The same processor also handles the interface to an external control computer.

Inventors:
 [1];  [2]
  1. 1300 Mills St., Menlo Park, CA 94025
  2. Santa Cruz, CA
Issue Date:
Research Org.:
X-RAY INSTRUMENTATION ASSOC
OSTI Identifier:
871215
Patent Number(s):
5684850
Assignee:
Warburton, William K. (Menlo Park, CA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
DOE Contract Number:  
FG03-92ER81311
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; digitally; based; speed; x-ray; spectrometer; signal; processing; accepts; input; data; detector-preamplifier; produces; spectral; analysis; x-rays; illuminating; detector; achieves; throughputs; cost; dividing; required; digital; steps; hardwired; processor; implemented; combinatorial; logic; detects; presence; signals; digitized; stream; extracts; filtered; estimates; amplitudes; programmable; computer; refines; amplitude; bins; produce; desired; set; algorithms; allow; hybrid; match; resolution; analog; systems; operating; rates; calibrating; handles; interface; external; control; x-ray spectrometer; digitally based; control computer; spectral analysis; digital signal; signal processing; processing steps; digital logic; data stream; input data; speed x-ray; processing step; processing computer; external control; digital processing; accepts input; data rate; signal process; x-rays illuminating; programmable digital; digital process; /378/702/

Citation Formats

Warburton, William K, and Hubbard, Bradley. Method and apparatus for digitally based high speed x-ray spectrometer. United States: N. p., 1997. Web.
Warburton, William K, & Hubbard, Bradley. Method and apparatus for digitally based high speed x-ray spectrometer. United States.
Warburton, William K, and Hubbard, Bradley. Wed . "Method and apparatus for digitally based high speed x-ray spectrometer". United States. https://www.osti.gov/servlets/purl/871215.
@article{osti_871215,
title = {Method and apparatus for digitally based high speed x-ray spectrometer},
author = {Warburton, William K and Hubbard, Bradley},
abstractNote = {A high speed, digitally based, signal processing system which accepts input data from a detector-preamplifier and produces a spectral analysis of the x-rays illuminating the detector. The system achieves high throughputs at low cost by dividing the required digital processing steps between a "hardwired" processor implemented in combinatorial digital logic, which detects the presence of the x-ray signals in the digitized data stream and extracts filtered estimates of their amplitudes, and a programmable digital signal processing computer, which refines the filtered amplitude estimates and bins them to produce the desired spectral analysis. One set of algorithms allow this hybrid system to match the resolution of analog systems while operating at much higher data rates. A second set of algorithms implemented in the processor allow the system to be self calibrating as well. The same processor also handles the interface to an external control computer.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Jan 01 00:00:00 EST 1997},
month = {Wed Jan 01 00:00:00 EST 1997}
}

Works referenced in this record:

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X‐ray signal processing electronics for solid state detectors
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