Negative ion beam injection apparatus with magnetic shield and electron removal means
Abstract
A negative ion source is constructed to produce H.sup.- ions without using Cesium. A high percentage of secondary electrons that typically accompany the extracted H.sup.- are trapped and eliminated from the beam by permanent magnets in the initial stage of acceleration. Penetration of the magnetic field from the permanent magnets into the ion source is minimized. This reduces the destructive effect the magnetic field could have on negative ion production and extraction from the source. A beam expansion section in the extractor results in a strongly converged final beam.
- Inventors:
-
- Berkeley, CA
- Hayward, CA
- Hercules, CA
- Issue Date:
- Research Org.:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- OSTI Identifier:
- 869604
- Patent Number(s):
- 5365070
- Assignee:
- Regents of University of California (Oakland, CA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- AC03-76SF00098
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- negative; beam; injection; apparatus; magnetic; shield; electron; removal; means; source; constructed; produce; cesium; percentage; secondary; electrons; typically; accompany; extracted; trapped; eliminated; permanent; magnets; initial; stage; acceleration; penetration; field; minimized; reduces; destructive; effect; production; extraction; expansion; section; extractor; results; strongly; converged; final; beam injection; permanent magnet; magnetic field; permanent magnets; secondary electrons; secondary electron; removal means; injection apparatus; final beam; initial stage; magnetic shield; /250/313/
Citation Formats
Anderson, Oscar A, Chan, Chun F, and Leung, Ka-Ngo. Negative ion beam injection apparatus with magnetic shield and electron removal means. United States: N. p., 1994.
Web.
Anderson, Oscar A, Chan, Chun F, & Leung, Ka-Ngo. Negative ion beam injection apparatus with magnetic shield and electron removal means. United States.
Anderson, Oscar A, Chan, Chun F, and Leung, Ka-Ngo. Sat .
"Negative ion beam injection apparatus with magnetic shield and electron removal means". United States. https://www.osti.gov/servlets/purl/869604.
@article{osti_869604,
title = {Negative ion beam injection apparatus with magnetic shield and electron removal means},
author = {Anderson, Oscar A and Chan, Chun F and Leung, Ka-Ngo},
abstractNote = {A negative ion source is constructed to produce H.sup.- ions without using Cesium. A high percentage of secondary electrons that typically accompany the extracted H.sup.- are trapped and eliminated from the beam by permanent magnets in the initial stage of acceleration. Penetration of the magnetic field from the permanent magnets into the ion source is minimized. This reduces the destructive effect the magnetic field could have on negative ion production and extraction from the source. A beam expansion section in the extractor results in a strongly converged final beam.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Jan 01 00:00:00 EST 1994},
month = {Sat Jan 01 00:00:00 EST 1994}
}
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