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Title: Process and apparatus for measuring degree of polarization and angle of major axis of polarized beam of light

Abstract

Apparatus and process are disclosed for calibrating measurements of the phase of the polarization of a polarized beam and the angle of the polarized optical beam's major axis of polarization at a diagnostic point with measurements of the same parameters at a point of interest along the polarized beam path prior to the diagnostic point. The process is carried out by measuring the phase angle of the polarization of the beam and angle of the major axis at the point of interest, using a rotatable polarizer and a detector, and then measuring these parameters again at a diagnostic point where a compensation apparatus, including a partial polarizer, which may comprise a stack of glass plates, is disposed normal to the beam path between a rotatable polarizer and a detector. The partial polarizer is then rotated both normal to the beam path and around the axis of the beam path until the detected phase of the beam polarization equals the phase measured at the point of interest. The rotatable polarizer at the diagnostic point may then be rotated manually to determine the angle of the major axis of the beam and this is compared with the measured angle of the majormore » axis of the beam at the point of interest during calibration. Thereafter, changes in the polarization phase, and in the angle of the major axis, at the point of interest can be monitored by measuring the changes in these same parameters at the diagnostic point.

Inventors:
 [1];  [2]
  1. Carmel, CA
  2. Livermore, CA
Issue Date:
Research Org.:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
OSTI Identifier:
869567
Patent Number(s):
5357342
Assignee:
United States of America as represented by United States (Washington, DC)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
process; apparatus; measuring; degree; polarization; angle; major; axis; polarized; beam; light; disclosed; calibrating; measurements; phase; optical; diagnostic; parameters; path; prior; carried; rotatable; polarizer; detector; compensation; including; partial; comprise; stack; glass; plates; disposed; normal; rotated; detected; equals; measured; manually; determine; compared; calibration; thereafter; changes; monitored; major axis; optical beam; phase angle; beam path; polarized beam; glass plates; glass plate; detected phase; /356/

Citation Formats

Decker, Derek E, and Toeppen, John S. Process and apparatus for measuring degree of polarization and angle of major axis of polarized beam of light. United States: N. p., 1994. Web.
Decker, Derek E, & Toeppen, John S. Process and apparatus for measuring degree of polarization and angle of major axis of polarized beam of light. United States.
Decker, Derek E, and Toeppen, John S. Sat . "Process and apparatus for measuring degree of polarization and angle of major axis of polarized beam of light". United States. https://www.osti.gov/servlets/purl/869567.
@article{osti_869567,
title = {Process and apparatus for measuring degree of polarization and angle of major axis of polarized beam of light},
author = {Decker, Derek E and Toeppen, John S},
abstractNote = {Apparatus and process are disclosed for calibrating measurements of the phase of the polarization of a polarized beam and the angle of the polarized optical beam's major axis of polarization at a diagnostic point with measurements of the same parameters at a point of interest along the polarized beam path prior to the diagnostic point. The process is carried out by measuring the phase angle of the polarization of the beam and angle of the major axis at the point of interest, using a rotatable polarizer and a detector, and then measuring these parameters again at a diagnostic point where a compensation apparatus, including a partial polarizer, which may comprise a stack of glass plates, is disposed normal to the beam path between a rotatable polarizer and a detector. The partial polarizer is then rotated both normal to the beam path and around the axis of the beam path until the detected phase of the beam polarization equals the phase measured at the point of interest. The rotatable polarizer at the diagnostic point may then be rotated manually to determine the angle of the major axis of the beam and this is compared with the measured angle of the major axis of the beam at the point of interest during calibration. Thereafter, changes in the polarization phase, and in the angle of the major axis, at the point of interest can be monitored by measuring the changes in these same parameters at the diagnostic point.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Jan 01 00:00:00 EST 1994},
month = {Sat Jan 01 00:00:00 EST 1994}
}