Method and apparatus for simultaneously measuring temperature and pressure
Abstract
Method and apparatus are provided for simultaneously measuring temperature and pressure in a class of crystalline materials having anisotropic thermal coefficients and having a coefficient of linear compression along the crystalline c-axis substantially the same as those perpendicular thereto. Temperature is determined by monitoring the fluorescence half life of a probe of such crystalline material, e.g., ruby. Pressure is determined by monitoring at least one other fluorescent property of the probe that depends on pressure and/or temperature, e.g., absolute fluorescent intensity or frequency shifts of fluorescent emission lines.
- Inventors:
-
- Livermore, CA
- Pleasanton, CA
- Issue Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- OSTI Identifier:
- 866708
- Patent Number(s):
- 4768886
- Assignee:
- Regents of University of California (Berkeley, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01D - MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
G - PHYSICS G01 - MEASURING G01K - MEASURING TEMPERATURE
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- method; apparatus; simultaneously; measuring; temperature; pressure; provided; crystalline; materials; anisotropic; thermal; coefficients; coefficient; linear; compression; c-axis; substantially; perpendicular; thereto; determined; monitoring; fluorescence; half; life; probe; material; ruby; fluorescent; property; depends; absolute; intensity; frequency; shifts; emission; lines; simultaneously measuring; perpendicular thereto; measuring temperature; crystalline materials; frequency shift; crystalline material; emission line; thermal coefficient; c-axis substantially; emission lines; half life; fluorescent emission; thermal coefficients; anisotropic thermal; axis substantially; /374/73/
Citation Formats
Hirschfeld, Tomas B, and Haugen, Gilbert R. Method and apparatus for simultaneously measuring temperature and pressure. United States: N. p., 1988.
Web.
Hirschfeld, Tomas B, & Haugen, Gilbert R. Method and apparatus for simultaneously measuring temperature and pressure. United States.
Hirschfeld, Tomas B, and Haugen, Gilbert R. Fri .
"Method and apparatus for simultaneously measuring temperature and pressure". United States. https://www.osti.gov/servlets/purl/866708.
@article{osti_866708,
title = {Method and apparatus for simultaneously measuring temperature and pressure},
author = {Hirschfeld, Tomas B and Haugen, Gilbert R},
abstractNote = {Method and apparatus are provided for simultaneously measuring temperature and pressure in a class of crystalline materials having anisotropic thermal coefficients and having a coefficient of linear compression along the crystalline c-axis substantially the same as those perpendicular thereto. Temperature is determined by monitoring the fluorescence half life of a probe of such crystalline material, e.g., ruby. Pressure is determined by monitoring at least one other fluorescent property of the probe that depends on pressure and/or temperature, e.g., absolute fluorescent intensity or frequency shifts of fluorescent emission lines.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Jan 01 00:00:00 EST 1988},
month = {Fri Jan 01 00:00:00 EST 1988}
}