Apparatus for sectioning demountable semiconductor samples
Abstract
Apparatus for use during polishing and sectioning operations of a ribbon sample is described. The sample holder includes a cylinder having an axially extending sample cavity terminated in a first funnel-shaped opening and a second slot-like opening. A spring-loaded pressure plunger is located adjacent the second opening of the sample cavity for frictional engagement of the sample prior to introduction of a molding medium in the sample cavity. A heat softenable molding medium is inserted in the funnel-shaped opening, to surround the sample. After polishing, the heater is energized to allow draining of the molding medium from the sample cavity. During manual polishing, the second end of the sample holder is inserted in a support ring which provides mechanical support as well as alignment of the sample holder during polishing. A gauge block for measuring the protrusion of a sample beyond the second wall of the holder is also disclosed.
- Inventors:
-
- Scottsdale, AZ
- Sun City West, AZ
- Issue Date:
- Research Org.:
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- OSTI Identifier:
- 865117
- Patent Number(s):
- 4463927
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
B - PERFORMING OPERATIONS B24 - GRINDING B24B - MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING
- DOE Contract Number:
- EG-77-C-01-4042
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- apparatus; sectioning; demountable; semiconductor; samples; polishing; operations; ribbon; sample; described; holder; cylinder; axially; extending; cavity; terminated; funnel-shaped; slot-like; spring-loaded; pressure; plunger; located; adjacent; frictional; engagement; prior; introduction; molding; medium; heat; softenable; inserted; surround; heater; energized; allow; draining; manual; support; provides; mechanical; alignment; gauge; block; measuring; protrusion; wall; disclosed; sample holder; located adjacent; axially extending; semiconductor sample; mechanical support; provides mechanical; sample prior; semiconductor samples; /249/33/269/451/
Citation Formats
Sopori, Bhushan L, and Wolf, Abraham. Apparatus for sectioning demountable semiconductor samples. United States: N. p., 1984.
Web.
Sopori, Bhushan L, & Wolf, Abraham. Apparatus for sectioning demountable semiconductor samples. United States.
Sopori, Bhushan L, and Wolf, Abraham. Sun .
"Apparatus for sectioning demountable semiconductor samples". United States. https://www.osti.gov/servlets/purl/865117.
@article{osti_865117,
title = {Apparatus for sectioning demountable semiconductor samples},
author = {Sopori, Bhushan L and Wolf, Abraham},
abstractNote = {Apparatus for use during polishing and sectioning operations of a ribbon sample is described. The sample holder includes a cylinder having an axially extending sample cavity terminated in a first funnel-shaped opening and a second slot-like opening. A spring-loaded pressure plunger is located adjacent the second opening of the sample cavity for frictional engagement of the sample prior to introduction of a molding medium in the sample cavity. A heat softenable molding medium is inserted in the funnel-shaped opening, to surround the sample. After polishing, the heater is energized to allow draining of the molding medium from the sample cavity. During manual polishing, the second end of the sample holder is inserted in a support ring which provides mechanical support as well as alignment of the sample holder during polishing. A gauge block for measuring the protrusion of a sample beyond the second wall of the holder is also disclosed.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 1984},
month = {Sun Jan 01 00:00:00 EST 1984}
}