Gaseous trace impurity analyzer and method
Abstract
Simple apparatus for analyzing trace impurities in a gas, such as helium or hydrogen, comprises means for drawing a measured volume of the gas as sample into a heated zone. A segregable portion of the zone is then chilled to condense trace impurities in the gas in the chilled portion. The gas sample is evacuated from the heated zone including the chilled portion. Finally, the chilled portion is warmed to vaporize the condensed impurities in the order of their boiling points. As the temperature of the chilled portion rises, pressure will develop in the evacuated, heated zone by the vaporization of an impurity. The temperature at which the pressure increase occurs identifies that impurity and the pressure increase attained until the vaporization of the next impurity causes a further pressure increase is a measure of the quantity of the preceding impurity.
- Inventors:
-
- (Bellport, NY)
- Setauket, NY
- Issue Date:
- Research Org.:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- OSTI Identifier:
- 863619
- Patent Number(s):
- 4214473
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- EY-76-C-02-0016
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- gaseous; trace; impurity; analyzer; method; simple; apparatus; analyzing; impurities; gas; helium; hydrogen; comprises; means; drawing; measured; volume; sample; heated; zone; segregable; portion; chilled; condense; evacuated; including; finally; warmed; vaporize; condensed; boiling; temperature; rises; pressure; vaporization; increase; occurs; identifies; attained; causes; measure; quantity; preceding; pressure increase; gas sample; trace impurities; comprises means; heated zone; simple apparatus; trace impurity; /73/374/
Citation Formats
Edwards, Jr., David, and Schneider, William. Gaseous trace impurity analyzer and method. United States: N. p., 1980.
Web.
Edwards, Jr., David, & Schneider, William. Gaseous trace impurity analyzer and method. United States.
Edwards, Jr., David, and Schneider, William. Tue .
"Gaseous trace impurity analyzer and method". United States. https://www.osti.gov/servlets/purl/863619.
@article{osti_863619,
title = {Gaseous trace impurity analyzer and method},
author = {Edwards, Jr., David and Schneider, William},
abstractNote = {Simple apparatus for analyzing trace impurities in a gas, such as helium or hydrogen, comprises means for drawing a measured volume of the gas as sample into a heated zone. A segregable portion of the zone is then chilled to condense trace impurities in the gas in the chilled portion. The gas sample is evacuated from the heated zone including the chilled portion. Finally, the chilled portion is warmed to vaporize the condensed impurities in the order of their boiling points. As the temperature of the chilled portion rises, pressure will develop in the evacuated, heated zone by the vaporization of an impurity. The temperature at which the pressure increase occurs identifies that impurity and the pressure increase attained until the vaporization of the next impurity causes a further pressure increase is a measure of the quantity of the preceding impurity.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 01 00:00:00 EST 1980},
month = {Tue Jan 01 00:00:00 EST 1980}
}