Superlattice strain gage
Abstract
A strain gage comprising a strained-layer superlattice crystal exhibiting piezoelectric properties is described. A substrate upon which such a strained-layer superlattice crystal has been deposited is attached to an element to be monitored for strain. A light source is focused on the superlattice crystal and the light reflected from, passed through, or emitted from the crystal is gathered and compared with previously obtained optical property data to determine the strain in the element. 8 figs.
- Inventors:
- Issue Date:
- Research Org.:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- OSTI Identifier:
- 6045619
- Patent Number(s):
- 7212854
- Application Number:
- ON: DE89011805
- Assignee:
- Dept. of Energy
- Patent Classifications (CPCs):
-
A - HUMAN NECESSITIES A61 - MEDICAL OR VETERINARY SCIENCE A61N - ELECTROTHERAPY
- DOE Contract Number:
- W-7405-ENG-36
- Resource Type:
- Patent
- Resource Relation:
- Other Information: Portions of this document are illegible in microfiche products
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; 36 MATERIALS SCIENCE; STRAIN GAGES; DESIGN; ALUMINIUM; ARSENIC; CRYSTAL GROWTH; CRYSTAL LATTICES; GALLIUM; INDIUM; INVENTIONS; PIEZOELECTRICITY; STRAINS; SUBSTRATES; CRYSTAL STRUCTURE; ELECTRICITY; ELEMENTS; MEASURING INSTRUMENTS; METALS; SEMIMETALS; 420200* - Engineering- Facilities, Equipment, & Techniques; 360603 - Materials- Properties
Citation Formats
Noel, B. W., Smith, D. L., and Sinha, D. N. Superlattice strain gage. United States: N. p., 1988.
Web.
Noel, B. W., Smith, D. L., & Sinha, D. N. Superlattice strain gage. United States.
Noel, B. W., Smith, D. L., and Sinha, D. N. Tue .
"Superlattice strain gage". United States. https://www.osti.gov/servlets/purl/6045619.
@article{osti_6045619,
title = {Superlattice strain gage},
author = {Noel, B. W. and Smith, D. L. and Sinha, D. N.},
abstractNote = {A strain gage comprising a strained-layer superlattice crystal exhibiting piezoelectric properties is described. A substrate upon which such a strained-layer superlattice crystal has been deposited is attached to an element to be monitored for strain. A light source is focused on the superlattice crystal and the light reflected from, passed through, or emitted from the crystal is gathered and compared with previously obtained optical property data to determine the strain in the element. 8 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jun 28 00:00:00 EDT 1988},
month = {Tue Jun 28 00:00:00 EDT 1988}
}
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