Title: Methods for aligning a spectrometer

Abstract

An example method for aligning a spectrometer is described herein. The spectrometer includes a radiation source, a crystal analyzer, and a detector that are all positioned on an instrument plane. The method includes rotating the crystal analyzer about an axis that is within the instrument plane and perpendicular to a rotation plane such that (i) a reciprocal lattice vector of the crystal analyzer is within the instrument plane or (ii) a component of the reciprocal lattice vector within the rotation plane is perpendicular to the instrument plane. An origin of the reciprocal lattice vector is located on the axis. The method further includes tilting the crystal analyzer or translating the detector such that the reciprocal lattice vector bisects a line segment that is bounded by the detector and the radiation source. Example spectrometers related to the example method are also disclosed.

Inventors:

Mortensen, Devon R.; Seidler, Gerald Todd

Issue Date:

Tue Mar 30 00:00:00 EDT 2021

Research Org.:

Univ. of Washington, Seattle, WA (United States)

Sponsoring Org.:

USDOE

OSTI Identifier:

1805678

Patent Number(s):

10962490

Application Number:

16/066,500

Assignee:

University of Washington (Seattle, WA)

Patent Classifications (CPCs):

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N23/20 - by using diffraction of the radiation by the materials, e.g. for investigating crystal structure
G01N23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system
G01N23/20016 - Goniometers
G01N23/20083 - {by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement}
G01N23/20091 - Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
G01N23/207 - Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
G01N23/2076 - {for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS}
G01N23/22 - by measuring secondary emission from the material

G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR

G21K1/06 - using diffraction, refraction or reflection, e.g. monochromators
G21K2201/06 - using diffractive, refractive or reflecting elements
G21K2201/062 - the element being a crystal
G21K2201/064 - having a curved surface
G21K2201/067 - Construction details

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DOE Contract Number:  

SC0002194; SC0008580

Resource Type:

Patent

Resource Relation:

Patent File Date: 12/28/2016

Country of Publication:

United States

Language:

English