Title: Multi-cone x-ray imaging Bragg crystal spectrometer

Abstract

Embodiments provide a multi-cone X-ray imaging Bragg crystal spectrometer for spectroscopy of small x-ray sources with a well-defined spectral resolution. The spectrometer includes a glass substrate machined to a multi-cone form; and a thin crystal slab attached to the glass substrate, whereby the multi-cone X-ray imaging Bragg crystal spectrometer provides rotational symmetry of a ray pattern, providing for accurate imaging, for each wavelength in the spectral range of interest. One or more embodiments include a streak camera and/or a gated strip detector.

Inventors:

Bitter, Manfred; Hill, Kenneth W.; Efthimion, Philip C.; Delgado-Apariccio, Luis; Pablant, Novimir; Gao, Lan; Kraus, Brian

Issue Date:

Tue Jun 09 00:00:00 EDT 2020

Research Org.:

Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)

Sponsoring Org.:

USDOE

OSTI Identifier:

1650995

Patent Number(s):

10677744

Application Number:

15/614,545

Assignee:

U.S. Department of Energy (Washington, DC)

Patent Classifications (CPCs):

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N2223/05 - by diffraction, scatter or reflection
G01N2223/056 - diffraction
G01N2223/0568 - spectro-diffractometry
G01N2223/315 - monochromators
G01N23/20 - by using diffraction of the radiation by the materials, e.g. for investigating crystal structure
G01N23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system
G01N23/20091 - Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
G01N23/207 - Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
G01N23/2076 - {for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS}

G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR

G21K1/06 - using diffraction, refraction or reflection, e.g. monochromators
G21K1/062 - {Devices having a multilayer structure}
G21K2201/062 - the element being a crystal
G21K2201/064 - having a curved surface
G21K2201/067 - Construction details

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DOE Contract Number:  

AC02-09CH11466

Resource Type:

Patent

Resource Relation:

Patent File Date: 06/05/2017

Country of Publication:

United States

Language:

English

Subject:

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY