Title: Nonlinear interferometer systems and methods

Abstract

Nonlinear interferometers include a nonlinear optical medium that is situated to produce a conjugate optical beam in response to a pump beam and a probe beam. The pump, probe, and conjugate beams propagate displaced from each other along a common optical path. One of the beams is selectively phase shifted, and the beams are then returned to the nonlinear medium, with the selectively phase shift beam phase shifted again. The nonlinear medium provides phase sensitive gain to at least one of the probe or conjugate beams, and the amplified beam is detected to provide an estimate of the phase shift.

Inventors:

Lukens, Joseph M.; Peters, Nicholas A.; Pooser, Raphael C.

Issue Date:

Tue Mar 31 00:00:00 EDT 2020

Research Org.:

Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Org.:

USDOE

OSTI Identifier:

1637766

Patent Number(s):

10605727

Application Number:

15/582,178

Assignee:

UT-Battelle, LLC (Oak Ridge, TN)

Patent Classifications (CPCs):

G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS

G - PHYSICS G01 - MEASURING G01C - MEASURING DISTANCES, LEVELS OR BEARINGS

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G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS

G01B2290/55 - Quantum effects
G01B9/02003 - {by using beat frequencies generated by mixing of two or more frequencies}
G01B9/02007 - {Two or more frequencies or sources used for interferometric measurement

G - PHYSICS G01 - MEASURING G01C - MEASURING DISTANCES, LEVELS OR BEARINGS

G01C19/64 - Gyrometers using the Sagnac effect, i.e. rotation-induced shifts between counter-rotating electromagnetic beams

G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT

G01J3/26 - using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N21/45 - using interferometric methods

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01S - DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT

H01S3/10007 - {in optical amplifiers}
H01S3/10023 - {by functional association of additional optical elements, e.g. filters, gratings, reflectors}
H01S3/10053 - {Phase control}

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DOE Contract Number:  

AC05-00OR22725

Resource Type:

Patent

Resource Relation:

Patent File Date: 04/28/2017

Country of Publication:

United States

Language:

English

Subject:

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS