Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets
Abstract
Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.
- Inventors:
- Issue Date:
- Research Org.:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1632476
- Patent Number(s):
- 10541109
- Application Number:
- 15/660,096
- Assignee:
- Battelle Memorial Institute (Richland, WA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- AC05-76RL01830
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 07/26/2017
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Citation Formats
Stanfill, Bryan A., Reehl, Sarah M., Johnson, Margaret C., Bramer, Lisa M., Browning, Nigel D., Stevens, Andrew J., and Kovarik, Libor. Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets. United States: N. p., 2020.
Web.
Stanfill, Bryan A., Reehl, Sarah M., Johnson, Margaret C., Bramer, Lisa M., Browning, Nigel D., Stevens, Andrew J., & Kovarik, Libor. Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets. United States.
Stanfill, Bryan A., Reehl, Sarah M., Johnson, Margaret C., Bramer, Lisa M., Browning, Nigel D., Stevens, Andrew J., and Kovarik, Libor. Tue .
"Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets". United States. https://www.osti.gov/servlets/purl/1632476.
@article{osti_1632476,
title = {Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets},
author = {Stanfill, Bryan A. and Reehl, Sarah M. and Johnson, Margaret C. and Bramer, Lisa M. and Browning, Nigel D. and Stevens, Andrew J. and Kovarik, Libor},
abstractNote = {Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 21 00:00:00 EST 2020},
month = {Tue Jan 21 00:00:00 EST 2020}
}
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