Microscale mass spectrometry systems, devices and related methods
Abstract
Mass spectrometry systems or assemblies therefore include an ionizer that includes at least one planar conductor, a mass analyzer with a planar electrode assembly, and a detector comprising at least one planar conductor. The ionizer, the mass analyzer and the detector are attached together in a compact stack assembly. The stack assembly has a perimeter that bounds an area that is between about 0.01 mm2 to about 25 cm2 and the stack assembly has a thickness that is between about 0.1 mm to about 25 mm.
- Inventors:
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1568310
- Patent Number(s):
- 10283341
- Application Number:
- 15/441,702
- Assignee:
- The University of North Carolina at Chapel Hill (Chapel Hill, NC)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10T - TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 02/24/2017
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 47 OTHER INSTRUMENTATION; 42 ENGINEERING
Citation Formats
Ramsey, John Michael. Microscale mass spectrometry systems, devices and related methods. United States: N. p., 2019.
Web.
Ramsey, John Michael. Microscale mass spectrometry systems, devices and related methods. United States.
Ramsey, John Michael. Tue .
"Microscale mass spectrometry systems, devices and related methods". United States. https://www.osti.gov/servlets/purl/1568310.
@article{osti_1568310,
title = {Microscale mass spectrometry systems, devices and related methods},
author = {Ramsey, John Michael},
abstractNote = {Mass spectrometry systems or assemblies therefore include an ionizer that includes at least one planar conductor, a mass analyzer with a planar electrode assembly, and a detector comprising at least one planar conductor. The ionizer, the mass analyzer and the detector are attached together in a compact stack assembly. The stack assembly has a perimeter that bounds an area that is between about 0.01 mm2 to about 25 cm2 and the stack assembly has a thickness that is between about 0.1 mm to about 25 mm.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue May 07 00:00:00 EDT 2019},
month = {Tue May 07 00:00:00 EDT 2019}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Microscale ion trap mass spectrometer
patent, October 2002
- Ramsey, J. Michael; Witten, William B.; Kornienko, Oleg
- US Patent Document 6,469,298
Mass spectrometers on wafer-substrates
patent, November 2005
- Pai, Chien-Shing; Pau, Stanley; Taylor, Joseph Ashley
- US Patent Document 6,967,326
Methods and apparatus for an ionizer
patent, December 2011
- Hughes, Donald M.; Renstrom, Inuka D.
- US Patent Document 8,080,085
Ion trap array-based systems and methods for chemical analysis
patent, August 2005
- Whitten, William B.; Ramsey, J. Michael
- US Patent Document 6,933,498
Microfabricated cylindrical ion trap
patent, March 2005
- Blain, Matthew G.
- US Patent Document 6,870,158
Microengineered Electrode Assembly
patent-application, January 2009
- Syms, Richard; Finlay, Alan
- US Patent Application 12/220321; 20090026361
Method and Apparatus for Enhanced Ion Mobility Based Sample Analysis Using Various Analyzer Configurations
patent-application, February 2012
- Miller, Raanan A.; Krylov, Evgeny; Nazarov, Erkinjon G.
- US Patent Application 13/205108; 20120025070
Portable gas chromatograph mass spectrometer for on-site chemical analyses
patent, March 2002
- Haas, Jeffrey; Bushman, John F.; Howard, Douglas E.
- US Patent Document 6,351,983
Mass Spectrometers on Wafer-substrates
patent-application, September 2005
- Pai, Chien-Shing; Pau, Stanley; Taylor, Joseph Ashley
- US Patent Application 10/789091; 20050189488
Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis
patent, April 2003
- Verentchikov, Anatoli N.; Campbell, Jennifer
- US Patent Document 6,545,268
Plasma ion mass analyzing apparatus
patent, February 2000
- Takada, Shinichi; Nakagawa, Yoshitomo
- US Patent Document 6,031,379
Air ionizer and method
patent, February 2005
- Gefter, Peter; Ignatenko, Alexander; Vijaykumar, Gopalan
- US Patent Document 6,850,403
Portable mass spectrometers
patent, January 2007
- Patterson, Garth E.; Knecht, Brent
- US Patent Document 7,161,142
Apparatus for Substrate Handling
patent-application, February 2005
- Fredrick, Joseph P.
- US Patent Application 10/643424; 20050042768
Thermal processes for subsurface formations
patent, October 2006
- Vinegar, Harold J.; Veenstra, Peter; Giles, Steven Paul
- US Patent Document 7,121,342