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Title: High accuracy absorbance spectrophotometers

Abstract

Spectrophotometers and spectroscopy processes are described that can provide for in-line calibration at every spectral acquisition as well as for continuous response correction during sample processing. The spectrophotometers include multiple polychromatic light sources that include characteristic emission spectra for use as an internal wavelength drift calibration system that is independent of environmental factors. Correction functions provided by the internal calibration process can be applied continuously and across an entire sample spectrum. The intensity response of each spectrometer in a spectrophotometer can also be monitored and continuously corrected for stray light, dark current, readout noise, etc.

Inventors:
; ; ; ;
Issue Date:
Research Org.:
Savannah River Site (SRS), Aiken, SC (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1497080
Patent Number(s):
10151633
Application Number:
15/428,639
Assignee:
Savannah River Nuclear Solutions, LLC (Aiken, SC)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
AC09-08SR22470; AC09-96SR18500
Resource Type:
Patent
Resource Relation:
Patent File Date: 2019 Feb 09
Country of Publication:
United States
Language:
English

Citation Formats

O'Rourke, Patrick E., Lascola, Robert J., Immel, David, Kyser, III, Edward A., and Plummer, Jean R. High accuracy absorbance spectrophotometers. United States: N. p., 2018. Web.
O'Rourke, Patrick E., Lascola, Robert J., Immel, David, Kyser, III, Edward A., & Plummer, Jean R. High accuracy absorbance spectrophotometers. United States.
O'Rourke, Patrick E., Lascola, Robert J., Immel, David, Kyser, III, Edward A., and Plummer, Jean R. Tue . "High accuracy absorbance spectrophotometers". United States. https://www.osti.gov/servlets/purl/1497080.
@article{osti_1497080,
title = {High accuracy absorbance spectrophotometers},
author = {O'Rourke, Patrick E. and Lascola, Robert J. and Immel, David and Kyser, III, Edward A. and Plummer, Jean R.},
abstractNote = {Spectrophotometers and spectroscopy processes are described that can provide for in-line calibration at every spectral acquisition as well as for continuous response correction during sample processing. The spectrophotometers include multiple polychromatic light sources that include characteristic emission spectra for use as an internal wavelength drift calibration system that is independent of environmental factors. Correction functions provided by the internal calibration process can be applied continuously and across an entire sample spectrum. The intensity response of each spectrometer in a spectrophotometer can also be monitored and continuously corrected for stray light, dark current, readout noise, etc.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Dec 11 00:00:00 EST 2018},
month = {Tue Dec 11 00:00:00 EST 2018}
}

Works referenced in this record:

Portable optical spectroscopy for accurate analysis of ethane in exhaled breath
journal, March 2007


Multi-channel detector assembly for downhole spectroscopy
patent, May 2014


Raman scattered light measuring apparatus
patent, May 1998


Saturated double-resonance emission spectroscopy of lead for sensitive atomic analysis
journal, January 1981


Interference-free optical detection for Raman spectroscopy
patent, November 2012


Calibration transfer for analytical instruments
patent, October 1995


Method for stabilizing the wavelength in a laser spectrometer system
patent, April 1998


Wavelength modulated photoacoustic spectrometer
patent, April 2003


Spectrum analyzing system with photodiode array
patent, June 1979