Quantitative secondary electron detection
Abstract
Quantitative Secondary Electron Detection (QSED) using the array of solid state devices (SSD) based electron-counters enable critical dimension metrology measurements in materials such as semiconductors, nanomaterials, and biological samples (FIG. 3). Methods and devices effect a quantitative detection of secondary electrons with the array of solid state detectors comprising a number of solid state detectors. An array senses the number of secondary electrons with a plurality of solid state detectors, counting the number of secondary electrons with a time to digital converter circuit in counter mode.
- Inventors:
- Issue Date:
- Research Org.:
- ScienceTomorrow LLC, Lexington, KY (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1440018
- Patent Number(s):
- 9966224
- Application Number:
- 14/918,560
- Assignee:
- ScienceTomorrow LLC (Lexington, KY)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- SC0009649
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2015 Oct 20
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Agrawal, Jyoti, Joy, David C., and Nayak, Subuhadarshi. Quantitative secondary electron detection. United States: N. p., 2018.
Web.
Agrawal, Jyoti, Joy, David C., & Nayak, Subuhadarshi. Quantitative secondary electron detection. United States.
Agrawal, Jyoti, Joy, David C., and Nayak, Subuhadarshi. Tue .
"Quantitative secondary electron detection". United States. https://www.osti.gov/servlets/purl/1440018.
@article{osti_1440018,
title = {Quantitative secondary electron detection},
author = {Agrawal, Jyoti and Joy, David C. and Nayak, Subuhadarshi},
abstractNote = {Quantitative Secondary Electron Detection (QSED) using the array of solid state devices (SSD) based electron-counters enable critical dimension metrology measurements in materials such as semiconductors, nanomaterials, and biological samples (FIG. 3). Methods and devices effect a quantitative detection of secondary electrons with the array of solid state detectors comprising a number of solid state detectors. An array senses the number of secondary electrons with a plurality of solid state detectors, counting the number of secondary electrons with a time to digital converter circuit in counter mode.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue May 08 00:00:00 EDT 2018},
month = {Tue May 08 00:00:00 EDT 2018}
}
Works referenced in this record:
Sensor Enhancement Through Algorithmic Acquisition Using Synchronization with a Scan Generator
patent-application, November 2014
- Martin, Douglas J.; Duncan, Adam; Barsun, Fred
- US Patent Application 14/208582; 20140331098
Plasma panel based ionizing radiation detector
patent-application, March 2006
- Friedman, Peter S.; Stoller, Ray A.
- US Patent Application 11/155660; 20060049362
Minimizing read disturb in an array flash cell
patent-application, March 2009
- Betser, Yoram; Sofer, Yair; Shlomo, Oren
- US Patent Application 12/232418; 20090073760
Method of High-Energy Particle Imaging by Computing a Difference Between Sampled Pixel Voltages
patent-application, September 2010
- Jin, Liang; Bikhorn, Robert B.; Nguyen-Hun, Xuong
- US Patent Application 12/408586; 20100237252
Image sensor using photo-detecting molecule and method of operating the same
patent-application, December 2009
- Seol, Kwang-soo; Park, Yoon-dong
- US Patent Application 12/385122; 20090294633