Wafer-scale pixelated detector system

Fahim, Farah; Deptuch, Grzegorz; Zimmerman, Tom

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A - human necessities
A01 - agriculture
A21 - baking
A22 - butchering
A23 - foods or foodstuffs
A24 - tobacco
A41 - wearing apparel
A42 - headwear
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A44 - haberdashery
A45 - hand or travelling articles
A46 - brushware
A47 - furniture
A61 - medical or veterinary science
A62 - life-saving
A63 - sports
A99 - subject matter not otherwise provided for in this section
B - performing operations
B01 - physical or chemical processes or apparatus in general
B02 - crushing, pulverising, or disintegrating
B03 - separation of solid materials using liquids or using pneumatic tables or jigs
B04 - centrifugal apparatus or machines for carrying-out physical or chemical processes
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B62 - land vehicles for travelling otherwise than on rails
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D - textiles
D01 - natural or man-made threads or fibres
D02 - yarns
D03 - weaving
D04 - braiding
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D06 - treatment of textiles or the like
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D10 - indexing scheme associated with sublasses of section d, relating to textiles
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Title: Wafer-scale pixelated detector system

Abstract

A large area, gapless, detection system comprises at least one sensor; an interposer operably connected to the at least one sensor; and at least one application specific integrated circuit operably connected to the sensor via the interposer wherein the detection system provides high dynamic range while maintaining small pixel area and low power dissipation. Thereby the invention provides methods and systems for a wafer-scale gapless and seamless detector systems with small pixels, which have both high dynamic range and low power dissipation.

Inventors:: Fahim, Farah; Deptuch, Grzegorz; Zimmerman, Tom

Issue Date:: Tue Oct 17 00:00:00 EDT 2017

Research Org.:: Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1399772

Patent Number(s):: 9794499

Application Number:: 14/696,651

Assignee:: Fermi Research Alliance, LLC

Patent Classifications (CPCs):: H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES

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H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
H01L27/14661 - {of the hybrid type}

Show less

DOE Contract Number:: AC02-07CH11359

Resource Type:: Patent

Resource Relation:: Patent File Date: 2015 Apr 27

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; 42 ENGINEERING

Citation Formats


                    Fahim, Farah, Deptuch, Grzegorz, and Zimmerman, Tom. Wafer-scale pixelated detector system.  United States: N. p., 2017. 
        Web.

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                    Fahim, Farah, Deptuch, Grzegorz, & Zimmerman, Tom. Wafer-scale pixelated detector system.  United States.

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                    Fahim, Farah, Deptuch, Grzegorz, and Zimmerman, Tom. Tue .  
        "Wafer-scale pixelated detector system".  United States.  https://www.osti.gov/servlets/purl/1399772.

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@article{osti_1399772,

  title        = {Wafer-scale pixelated detector system},

  author       = {Fahim, Farah and Deptuch, Grzegorz and Zimmerman, Tom},

  abstractNote = {A large area, gapless, detection system comprises at least one sensor; an interposer operably connected to the at least one sensor; and at least one application specific integrated circuit operably connected to the sensor via the interposer wherein the detection system provides high dynamic range while maintaining small pixel area and low power dissipation. Thereby the invention provides methods and systems for a wafer-scale gapless and seamless detector systems with small pixels, which have both high dynamic range and low power dissipation.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Tue Oct 17 00:00:00 EDT 2017},

  month        = {Tue Oct 17 00:00:00 EDT 2017}

}

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Similar Records

Title: Wafer-scale pixelated detector system

Abstract

Citation Formats

Multi-Range Signal Integrator Which Changes Range Only at Specific Times patent, November 1973

Digital-to-analog converter with cyclic control of current sources patent, June 1990

Apparatus and method for removing scatter from an x-ray image patent, July 1997

Current-mode parallel analog-to-digital converter patent, October 1997

Electronic packaging technique to improve sensor failure robustness patent, October 2011

Semiconductor device, solid-state image sensor and camera system for reducing the influence of noise at a connection between chips patent, July 2015

Stacked flip chip assemblies patent-application, June 2002

Solid-state image pickup device and control method thereof patent-application, April 2004

Physical Quantity Detection Device, Method of Driving Physical Quantity Detection Device, and Imaging Apparatus patent-application, February 2008

Apparatus for Detecting Target Molecules and Related Methods patent-application, March 2008

TFA Image Sensor With Stability-Optimized Photodiode patent-application, June 2008

CT Detector Module Construction patent-application, July 2008

Semiconductor Image Sensor Module and Method of Manufacturing the Same patent-application, November 2010

Silicon Photomultiplier Detector for Computed Tomography patent-application, December 2010

Electronic Packaging Technique to Improve Sensor Failure Robustness patent-application, March 2011

Detector Array With a Through-Via Interposer patent-application, May 2012

Image Capture Device patent-application, May 2012

Radiation Detector Assembly With Test Circuitry patent-application, September 2012

Semiconductor Device, Solid-State Image Sensor and Camera System patent-application, November 2012

Interposer to Regulate Current for Wafer Test Tooling patent-application, January 2014

AGIPD - The adaptive gain integrating pixel detector for the European XFEL development and status conference, October 2011

A Dynamic Slew Correction Circuit for Low Noise Silicon Detector Pre-amplifiers journal, June 2012

Multi-Range Signal Integrator Which Changes Range Only at Specific Times
patent, November 1973

Digital-to-analog converter with cyclic control of current sources
patent, June 1990

Apparatus and method for removing scatter from an x-ray image
patent, July 1997

Current-mode parallel analog-to-digital converter
patent, October 1997

Electronic packaging technique to improve sensor failure robustness
patent, October 2011

Semiconductor device, solid-state image sensor and camera system for reducing the influence of noise at a connection between chips
patent, July 2015

Stacked flip chip assemblies
patent-application, June 2002

Solid-state image pickup device and control method thereof
patent-application, April 2004

Physical Quantity Detection Device, Method of Driving Physical Quantity Detection Device, and Imaging Apparatus
patent-application, February 2008

Apparatus for Detecting Target Molecules and Related Methods
patent-application, March 2008

TFA Image Sensor With Stability-Optimized Photodiode
patent-application, June 2008

CT Detector Module Construction
patent-application, July 2008

Semiconductor Image Sensor Module and Method of Manufacturing the Same
patent-application, November 2010

Silicon Photomultiplier Detector for Computed Tomography
patent-application, December 2010

Electronic Packaging Technique to Improve Sensor Failure Robustness
patent-application, March 2011

Detector Array With a Through-Via Interposer
patent-application, May 2012

Image Capture Device
patent-application, May 2012

Radiation Detector Assembly With Test Circuitry
patent-application, September 2012

Semiconductor Device, Solid-State Image Sensor and Camera System
patent-application, November 2012

Interposer to Regulate Current for Wafer Test Tooling
patent-application, January 2014

AGIPD - The adaptive gain integrating pixel detector for the European XFEL development and status
conference, October 2011

A Dynamic Slew Correction Circuit for Low Noise Silicon Detector Pre-amplifiers
journal, June 2012