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Title: Dry etch method for texturing silicon and device

Abstract

A method for texturing silicon includes loading a silicon wafer into a vacuum chamber, heating the silicon wafer and thermal cracking a gas to generate cracked sulfur species. The silicon wafer is exposed to the cracked sulfur species for a time duration in accordance with a texture characteristic needed for a surface of the silicon wafer.

Inventors:
; ; ;
Issue Date:
Research Org.:
International Business Machines Corp., Armonk, NY (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1372649
Patent Number(s):
9716195
Application Number:
14/747,954
Assignee:
International Business Machines Corporation
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE Y02E - REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
DOE Contract Number:  
EE0006334
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 Jun 23
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Gershon, Talia S., Haight, Richard A., Kim, Jeehwan, and Lee, Yun Seog. Dry etch method for texturing silicon and device. United States: N. p., 2017. Web.
Gershon, Talia S., Haight, Richard A., Kim, Jeehwan, & Lee, Yun Seog. Dry etch method for texturing silicon and device. United States.
Gershon, Talia S., Haight, Richard A., Kim, Jeehwan, and Lee, Yun Seog. Tue . "Dry etch method for texturing silicon and device". United States. https://www.osti.gov/servlets/purl/1372649.
@article{osti_1372649,
title = {Dry etch method for texturing silicon and device},
author = {Gershon, Talia S. and Haight, Richard A. and Kim, Jeehwan and Lee, Yun Seog},
abstractNote = {A method for texturing silicon includes loading a silicon wafer into a vacuum chamber, heating the silicon wafer and thermal cracking a gas to generate cracked sulfur species. The silicon wafer is exposed to the cracked sulfur species for a time duration in accordance with a texture characteristic needed for a surface of the silicon wafer.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jul 25 00:00:00 EDT 2017},
month = {Tue Jul 25 00:00:00 EDT 2017}
}

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patent-application, May 2012


Polycrystalline-Type Solar Cell Panel and Process For Production Thereof
patent-application, April 2013


Plasma Etching Method
patent-application, February 2014


Hydrogen Sulfide as an Etchant for Silicon
journal, January 1969


Anisotropic Reactive Ion Etching of Silicon Using SF6/O2/CHF3 Gas Mixtures
journal, January 1995