Dry etch method for texturing silicon and device
Abstract
A method for texturing silicon includes loading a silicon wafer into a vacuum chamber, heating the silicon wafer and thermal cracking a gas to generate cracked sulfur species. The silicon wafer is exposed to the cracked sulfur species for a time duration in accordance with a texture characteristic needed for a surface of the silicon wafer.
- Inventors:
- Issue Date:
- Research Org.:
- International Business Machines Corp., Armonk, NY (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1372649
- Patent Number(s):
- 9716195
- Application Number:
- 14/747,954
- Assignee:
- International Business Machines Corporation
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE Y02E - REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- DOE Contract Number:
- EE0006334
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2015 Jun 23
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Gershon, Talia S., Haight, Richard A., Kim, Jeehwan, and Lee, Yun Seog. Dry etch method for texturing silicon and device. United States: N. p., 2017.
Web.
Gershon, Talia S., Haight, Richard A., Kim, Jeehwan, & Lee, Yun Seog. Dry etch method for texturing silicon and device. United States.
Gershon, Talia S., Haight, Richard A., Kim, Jeehwan, and Lee, Yun Seog. Tue .
"Dry etch method for texturing silicon and device". United States. https://www.osti.gov/servlets/purl/1372649.
@article{osti_1372649,
title = {Dry etch method for texturing silicon and device},
author = {Gershon, Talia S. and Haight, Richard A. and Kim, Jeehwan and Lee, Yun Seog},
abstractNote = {A method for texturing silicon includes loading a silicon wafer into a vacuum chamber, heating the silicon wafer and thermal cracking a gas to generate cracked sulfur species. The silicon wafer is exposed to the cracked sulfur species for a time duration in accordance with a texture characteristic needed for a surface of the silicon wafer.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jul 25 00:00:00 EDT 2017},
month = {Tue Jul 25 00:00:00 EDT 2017}
}
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