Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument
Abstract
A method and an ultrahigh-resolution spectrometer including a precision mechanical structure for positioning inelastic X-ray scattering optics are provided. The spectrometer includes an X-ray monochromator and an X-ray analyzer, each including X-ray optics of a collimating (C) crystal, a pair of dispersing (D) element crystals, anomalous transmission filter (F) and a wavelength (W) selector crystal. A respective precision mechanical structure is provided with the X-ray monochromator and the X-ray analyzer. The precision mechanical structure includes a base plate, such as an aluminum base plate; positioning stages for D-crystal alignment; positioning stages with an incline sensor for C/F/W-crystal alignment, and the positioning stages including flexure-based high-stiffness structure.
- Inventors:
- Issue Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1348215
- Patent Number(s):
- 9008272
- Application Number:
- 13/551,788
- Assignee:
- UChicago Argonne, LLC (Chicago, IL)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10T - TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- DOE Contract Number:
- AC02-06CH11357
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2012 Jul 18
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE
Citation Formats
Shu, Deming, Shvydko, Yuri, Stoupin, Stanislav A., Khachatryan, Ruben, Goetze, Kurt A., and Roberts, Timothy. Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument. United States: N. p., 2015.
Web.
Shu, Deming, Shvydko, Yuri, Stoupin, Stanislav A., Khachatryan, Ruben, Goetze, Kurt A., & Roberts, Timothy. Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument. United States.
Shu, Deming, Shvydko, Yuri, Stoupin, Stanislav A., Khachatryan, Ruben, Goetze, Kurt A., and Roberts, Timothy. Tue .
"Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument". United States. https://www.osti.gov/servlets/purl/1348215.
@article{osti_1348215,
title = {Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument},
author = {Shu, Deming and Shvydko, Yuri and Stoupin, Stanislav A. and Khachatryan, Ruben and Goetze, Kurt A. and Roberts, Timothy},
abstractNote = {A method and an ultrahigh-resolution spectrometer including a precision mechanical structure for positioning inelastic X-ray scattering optics are provided. The spectrometer includes an X-ray monochromator and an X-ray analyzer, each including X-ray optics of a collimating (C) crystal, a pair of dispersing (D) element crystals, anomalous transmission filter (F) and a wavelength (W) selector crystal. A respective precision mechanical structure is provided with the X-ray monochromator and the X-ray analyzer. The precision mechanical structure includes a base plate, such as an aluminum base plate; positioning stages for D-crystal alignment; positioning stages with an incline sensor for C/F/W-crystal alignment, and the positioning stages including flexure-based high-stiffness structure.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 14 00:00:00 EDT 2015},
month = {Tue Apr 14 00:00:00 EDT 2015}
}
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