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Title: Band excitation method applicable to scanning probe microscopy

Abstract

Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.

Inventors:
;
Issue Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1338057
Patent Number(s):
9535087
Application Number:
14/752,387
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Classifications (CPCs):
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 Jun 26
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

Jesse, Stephen, and Kalinin, Sergei V. Band excitation method applicable to scanning probe microscopy. United States: N. p., 2017. Web.
Jesse, Stephen, & Kalinin, Sergei V. Band excitation method applicable to scanning probe microscopy. United States.
Jesse, Stephen, and Kalinin, Sergei V. Tue . "Band excitation method applicable to scanning probe microscopy". United States. https://www.osti.gov/servlets/purl/1338057.
@article{osti_1338057,
title = {Band excitation method applicable to scanning probe microscopy},
author = {Jesse, Stephen and Kalinin, Sergei V.},
abstractNote = {Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 03 00:00:00 EST 2017},
month = {Tue Jan 03 00:00:00 EST 2017}
}

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Scanning probe microscope
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Band excitation method applicable to scanning probe microscopy
patent, August 2010


Band excitation method applicable to scanning probe microscopy
patent, May 2013


Chemical Sensor with Oscillating Cantilevered Probe and Mechanical Stop
patent-application, January 2005


Scanning probe microscopy apparatus and techniques
patent-application, December 2005