Infrared detector device inspection system
Abstract
Methods and apparatuses for identifying carrier lifetimes are disclosed herein. In a general embodiment, a beam of light is sent to a group of locations on a material for an optical device. Photons emitted from the material are detected at each of the group of locations. A carrier lifetime is identified for each of the group of locations based on the photons detected from each of the group of locations.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1289555
- Patent Number(s):
- 9410900
- Application Number:
- 14/689,167
- Assignee:
- Sandia Corporation (Albuquerque, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2015 Apr 17
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Citation Formats
Soehnel, Grant, and Bender, Daniel A. Infrared detector device inspection system. United States: N. p., 2016.
Web.
Soehnel, Grant, & Bender, Daniel A. Infrared detector device inspection system. United States.
Soehnel, Grant, and Bender, Daniel A. Tue .
"Infrared detector device inspection system". United States. https://www.osti.gov/servlets/purl/1289555.
@article{osti_1289555,
title = {Infrared detector device inspection system},
author = {Soehnel, Grant and Bender, Daniel A.},
abstractNote = {Methods and apparatuses for identifying carrier lifetimes are disclosed herein. In a general embodiment, a beam of light is sent to a group of locations on a material for an optical device. Photons emitted from the material are detected at each of the group of locations. A carrier lifetime is identified for each of the group of locations based on the photons detected from each of the group of locations.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Aug 09 00:00:00 EDT 2016},
month = {Tue Aug 09 00:00:00 EDT 2016}
}
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Works referenced in this record:
Time resolved photo-luminescent decay characterization of mercury cadmium telluride focal plane arrays
journal, January 2015
- Soehnel, Grant
- Optics Express, Vol. 23, Issue 2