Cantilevered probe detector with piezoelectric element
Abstract
A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.
- Inventors:
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1176224
- Patent Number(s):
- 7694346
- Application Number:
- 11/576,443
- Assignee:
- Board of Regents of the Nevada System of Higher Education on behalf of the University of Nevada (Reno, NV)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2005 Sep 30
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 45 MILITARY TECHNOLOGY, WEAPONRY, AND NATIONAL DEFENSE
Citation Formats
Adams, Jesse D., Sulchek, Todd A., and Feigin, Stuart C. Cantilevered probe detector with piezoelectric element. United States: N. p., 2010.
Web.
Adams, Jesse D., Sulchek, Todd A., & Feigin, Stuart C. Cantilevered probe detector with piezoelectric element. United States.
Adams, Jesse D., Sulchek, Todd A., and Feigin, Stuart C. Tue .
"Cantilevered probe detector with piezoelectric element". United States. https://www.osti.gov/servlets/purl/1176224.
@article{osti_1176224,
title = {Cantilevered probe detector with piezoelectric element},
author = {Adams, Jesse D. and Sulchek, Todd A. and Feigin, Stuart C.},
abstractNote = {A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 06 00:00:00 EDT 2010},
month = {Tue Apr 06 00:00:00 EDT 2010}
}
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CMOS monolithic mechatronic microsystem for surface imaging and force response studies
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Thermal and ambient‐induced deflections of scanning force microscope cantilevers
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In situ cell detection using piezoelectric lead zirconate titanate-stainless steel cantilevers
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Organic vapor sensing using a coated piezoelectric quartz crystal sensor array
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Tuning forks as micromechanical mass sensitive sensors for bio- or liquid detection
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Isothermal Measurements and Thermal Desorption of Organic Vapors Using SAW Devices
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Piezoelectric Sensor for Detecting Force Gradients in Atomic Force Microscopy
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Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation
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