Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution
Abstract
A highly sensitive and high resolution magnetic microscope images magnetic properties quantitatively. Imaging is done with a modified transmission electron microscope that allows imaging of the sample in a zero magnetic field. Two images from closely spaced planes, one in focus and one slightly out of focus, are sufficient to calculate the absolute values of the phase change imparted to the electrons, and hence obtain the magnetization vector field distribution.
- Inventors:
- Issue Date:
- Research Org.:
- Univ. of California, Oakland, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1174393
- Patent Number(s):
- 6590209
- Application Number:
- 09/516,878
- Assignee:
- The Regents of the University of California (Oakland, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Citation Formats
Bajt, Sasa. Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution. United States: N. p., 2003.
Web.
Bajt, Sasa. Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution. United States.
Bajt, Sasa. Tue .
"Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution". United States. https://www.osti.gov/servlets/purl/1174393.
@article{osti_1174393,
title = {Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution},
author = {Bajt, Sasa},
abstractNote = {A highly sensitive and high resolution magnetic microscope images magnetic properties quantitatively. Imaging is done with a modified transmission electron microscope that allows imaging of the sample in a zero magnetic field. Two images from closely spaced planes, one in focus and one slightly out of focus, are sufficient to calculate the absolute values of the phase change imparted to the electrons, and hence obtain the magnetization vector field distribution.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jul 08 00:00:00 EDT 2003},
month = {Tue Jul 08 00:00:00 EDT 2003}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Noninterferometric Phase Imaging with Partially Coherent Light
journal, March 1998
- Paganin, D.; Nugent, K. A.
- Physical Review Letters, Vol. 80, Issue 12
Improved high resolution image processing of bright field electron micrographs
journal, January 1984
- Kirkland, Earl J.
- Ultramicroscopy, Vol. 15, Issue 3
Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy
journal, December 1992
- Coene, Wim; Janssen, Guido; Op de Beeck, Marc
- Physical Review Letters, Vol. 69, Issue 26
Practical Image Restoration of Thick Biological Specimens Using Multiple Focus Levels in Transmission Electron Microscopy
journal, December 1997
- Han, Karen F.; Sedat, John W.; Agard, David A.
- Journal of Structural Biology, Vol. 120, Issue 3
Quantitative phase-sensitive imaging in a transmission electron microscope
journal, May 2000
- Bajt, S.; Barty, A.; Nugent, K. A.
- Ultramicroscopy, Vol. 83, Issue 1-2