Nano-soldering to single atomic layer
Abstract
A simple technique to solder submicron sized, ohmic contacts to nanostructures has been disclosed. The technique has several advantages over standard electron beam lithography methods, which are complex, costly, and can contaminate samples. To demonstrate the soldering technique graphene, a single atomic layer of carbon, has been contacted, and low- and high-field electronic transport properties have been measured.
- Inventors:
-
- Berkeley, CA
- Kensington, CA
- Issue Date:
- Research Org.:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1029265
- Patent Number(s):
- 8033445
- Application Number:
- 12/270,643
- Assignee:
- The Regents of the University of California (Oakland, CA)
- Patent Classifications (CPCs):
-
B - PERFORMING OPERATIONS B23 - MACHINE TOOLS B23K - SOLDERING OR UNSOLDERING
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
- DOE Contract Number:
- AC02-05CH11231
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Girit, Caglar O, and Zettl, Alexander K. Nano-soldering to single atomic layer. United States: N. p., 2011.
Web.
Girit, Caglar O, & Zettl, Alexander K. Nano-soldering to single atomic layer. United States.
Girit, Caglar O, and Zettl, Alexander K. Tue .
"Nano-soldering to single atomic layer". United States. https://www.osti.gov/servlets/purl/1029265.
@article{osti_1029265,
title = {Nano-soldering to single atomic layer},
author = {Girit, Caglar O and Zettl, Alexander K},
abstractNote = {A simple technique to solder submicron sized, ohmic contacts to nanostructures has been disclosed. The technique has several advantages over standard electron beam lithography methods, which are complex, costly, and can contaminate samples. To demonstrate the soldering technique graphene, a single atomic layer of carbon, has been contacted, and low- and high-field electronic transport properties have been measured.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Oct 11 00:00:00 EDT 2011},
month = {Tue Oct 11 00:00:00 EDT 2011}
}
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Soldering to a single atomic layer
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