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Title: Spin microscope based on optically detected magnetic resonance

Abstract

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Inventors:
 [1];  [1]
  1. Los Alamos, NM
Issue Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
993097
Patent Number(s):
7,752,899
Application Number:
11/845,865
Assignee:
The United States of America as represented by the United States Department of Energy (Washington, DC)
DOE Contract Number:  
W-7405-ENG-36
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Berman, Gennady P, and Chernobrod, Boris M. Spin microscope based on optically detected magnetic resonance. United States: N. p., 2010. Web.
Berman, Gennady P, & Chernobrod, Boris M. Spin microscope based on optically detected magnetic resonance. United States.
Berman, Gennady P, and Chernobrod, Boris M. Tue . "Spin microscope based on optically detected magnetic resonance". United States. https://www.osti.gov/servlets/purl/993097.
@article{osti_993097,
title = {Spin microscope based on optically detected magnetic resonance},
author = {Berman, Gennady P and Chernobrod, Boris M},
abstractNote = {The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2010},
month = {7}
}

Patent:

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